Novel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials

Y. Waseda (Autor)

Buch | Softcover

VI, 186 Seiten

1984
Springer Berlin (Verlag)
9783540133599 (ISBN)

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A brief background of the present requirement for structural characterization of disordered materials.- Fundamental relationships between rdf and scattering intensity.- Definition of partial structure factors and compositional short range order (CSRO).- Experimental determination of partial structural functions.- Nature of anomalous x-ray scattering and its application for structural analysis of disordered materials.- Theoretical aspects on the anomalous dispersion factors of x-rays.- Experimental determination of the anomalous dispersion factors.- Selected examples of structural determination using anomalous (resonance) x-ray scattering.- Relative merits of anomalous x-ray scattering and its future prospects.

Erscheint lt. Verlag	1.7.1984
Reihe/Serie	Lecture Notes in Physics
Zusatzinfo	VI, 186 p.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	320 g
Themenwelt	Naturwissenschaften ► Geowissenschaften ► Geologie
	Naturwissenschaften ► Geowissenschaften ► Mineralogie / Paläontologie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Technik ► Maschinenbau
Schlagworte	Dispersion • Experiment • Materials • Röntgenbeugung • scattering • Structure • Ungeordnetes System • X-Ray • X-ray crystallography
ISBN-13	9783540133599 / 9783540133599
Zustand	Neuware