Electron Microscopy – Principles and Fundamentals
Wiley-VCH Verlag GmbH (Hersteller)
978-3-527-61456-1 (ISBN)
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Derived from the successful three-volume "Handbook of Microscopy", this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.The topics include: Stationary Beam Methods: Transmission Electron Microscopy, Electron Energy Loss Spectroscopy, Convergent Electron Beam Diffraction, Low Energy Electron Microscopy, Electron Holographic Methods Scanning Beam Methods: Scanning Transmission Electron Microscopy, Scanning Auger and XPS Microscopy, Scanning Microanalysis, Imaging Secondary Ion Mass Spectrometry Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis, and, Spin Polarized Low Energy Electron Microscopy. Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
S. Amelinckx, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium. Dirk van Dyck, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium. J. van Landuyt, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium. Gustaaf van Tendeloo, Electron Microscopy for Materials Science (EMAT), University of Antwerp, Belgium.
STATIONARY BEAM METHODS Transmission Electron Microscopy Reflection Electro Microscopy Electron Energy Loss Spectroscopy High-Voltage Electron Microscopy Convergent Electron Beam Diffraction Low Energy Electron Microscopy Lorentz Microscopy Electron holographic Methods SCANNING BEAM METHODS Scanning Reflection Electron Microscopy Scanning Transmission Electron Microscopy Scanning Transmission Electron Microscopy: Z-Contrast Scanning Auger and XPS Microscopy Scanning Microanalysis Imaging Secondary Ion Mass Spectrometry
| Verlagsort | Weinheim |
|---|---|
| Sprache | englisch |
| Maße | 245 x 176 mm |
| Gewicht | 1110 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie |
| Technik ► Maschinenbau | |
| ISBN-10 | 3-527-61456-7 / 3527614567 |
| ISBN-13 | 978-3-527-61456-1 / 9783527614561 |
| Zustand | Neuware |
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