Microstructural Investigation and Analysis

B. Jouffrey, J. Svejcar (Herausgeber)

Software / Digital Media

338 Seiten

2006
Wiley-VCH Verlag GmbH (Hersteller)
978-3-527-60616-0 (ISBN)

Infos

Modern understanding of materials include the approach at the microscopic or nanometric level. In the best case, imaging at the atomic level is possible. These approaches are essential for instance in the exploration of interfaces, surfaces and defects in crystals. Several aspects can be explored, the microstructure, local element composition, and chemical bonds. This book presents the state-of-the-art of modern investigation methods of materials.

Inhalt

Scanning and Transmission Electron Microscopy Convergent Beam Electron Diffraction X-Ray Characterization EELS X-Ray Synchrotron Radiation (EXAFS, XANES) SIMS Auger Microscopy PIXE Near Field Microscopy

Produkt-Details

• Erscheint lt. Verlag: 9.5.2006
• Reihe/Serie: Euromat 99 S.
• Verlagsort: Weinheim
• Sprache: englisch
• Gewicht: 10 g
• Themenwelt: Naturwissenschaften ► Chemie
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 3-527-60616-5 / 3527606165
• ISBN-13: 978-3-527-60616-0 / 9783527606160
• Zustand: Neuware