Surface Analysis with STM and AFM – Experimental and Theoretical Aspects of Image Analysis
Seiten
2007
Wiley-VCH Verlag GmbH (Hersteller)
978-3-527-61511-7 (ISBN)
Wiley-VCH Verlag GmbH (Hersteller)
978-3-527-61511-7 (ISBN)
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Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. This book brings together various components of STM and AFM studies: practical aspects of STM, image simulation by surface electron density plot calculations, and qualitative evaluation of tip-force induced surface corrugations.
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: the practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: inorganic layered materials, organic conductors, organic adsorbates at liquid-solid interfaces, self-assembled amphiphiles, and polymers. This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: the practical aspects of STM, the image simulation by surface electron density plot calculations, and the qualitative evaluation of tip-force induced surface corrugations. Practical examples are taken from: inorganic layered materials, organic conductors, organic adsorbates at liquid-solid interfaces, self-assembled amphiphiles, and polymers. This book will be an invaluable reference work for researchers active in STM and AMF as well as for newcomers to the field.
Sergei N. Magonov is the author of Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, published by Wiley. Myung-Hwan Whangbo is the author of Surface Analysis with STM and AFM: Experimental and Theoretical Aspects of Image Analysis, published by Wiley.
Introduction Theory of STM and AFM Practical Aspects of STM and AFM Imaging Inorganic Layered Compounds Organic Conductors Organic Layers on Conducting Surfaces Other Examples and Unresolved Problems Conclusions
| Verlagsort | Weinheim |
|---|---|
| Sprache | englisch |
| Maße | 175 x 245 mm |
| Gewicht | 795 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie |
| Technik ► Maschinenbau | |
| ISBN-10 | 3-527-61511-3 / 3527615113 |
| ISBN-13 | 978-3-527-61511-7 / 9783527615117 |
| Zustand | Neuware |
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