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Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers
Buch | Hardcover
304 Seiten
2010
Academic Press Inc (Verlag)
978-0-12-381318-3 (ISBN)
CHF 309,95 inkl. MwSt
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Includes articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in different domains.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

1. Charged particles in electromagnetic fields2. Language of aberration expansions in charged particle optics3. Transporting charged particle beams in static fields4. Transporting charged particles in radiofrequency fields5. Static magnetic charged particle analyzers6. Electrostatic energy analyzers7. Mass analyzers with combined electrostatic and magnetic fields8. Time-of-flight mass analyzers9. Radiofrequency mass analyzers

Erscheint lt. Verlag 18.5.2010
Reihe/Serie Advances in Imaging and Electron Physics
Mitarbeit Herausgeber (Serie): Peter W. Hawkes
Verlagsort San Diego
Sprache englisch
Maße 152 x 229 mm
Gewicht 540 g
Themenwelt Naturwissenschaften Physik / Astronomie Angewandte Physik
Naturwissenschaften Physik / Astronomie Hochenergiephysik / Teilchenphysik
Technik Elektrotechnik / Energietechnik
ISBN-10 0-12-381318-2 / 0123813182
ISBN-13 978-0-12-381318-3 / 9780123813183
Zustand Neuware
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