Transmission Electron Microscopy

Physics of Image Formation

Ludwig Reimer, Helmut Kohl (Autoren)

Buch | Softcover

590 Seiten

2010 | Softcover reprint of hardcover 5th ed. 2008
Springer-Verlag New York Inc.
978-1-4419-2308-0 (ISBN)

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The aim of this monograph is to outline the physics of image formation, electron–specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Particle Optics of Electrons.- Wave Optics of Electrons.- Elements of a Transmission Electron Microscope.- Electron–Specimen Interactions..- Scattering and Phase Contrast.- Theory of Electron Diffraction.- Electron-Diffraction Modesand Applications ..- Imaging of Crystalline Specimens and Their Defects..- Elemental Analysis by X-ray and Electron Energy-Loss Spectroscopy..- Specimen Damage by Electron Irradiation.

Erscheint lt. Verlag	19.11.2010
Reihe/Serie	Springer Series in Optical Sciences ; 36
Zusatzinfo	276 Illustrations, black and white; XVI, 590 p. 276 illus.
Verlagsort	New York, NY
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Schulbuch / Wörterbuch
	Geisteswissenschaften
	Naturwissenschaften ► Biologie ► Zellbiologie
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Naturwissenschaften ► Physik / Astronomie ► Thermodynamik
	Sozialwissenschaften
	Technik
ISBN-10	1-4419-2308-X / 144192308X
ISBN-13	978-1-4419-2308-0 / 9781441923080
Zustand	Neuware