Advances in Imaging and Electron Physics (eBook)

eBook Download: PDF

1995 | 1. Auflage
405 Seiten
Elsevier Science (Verlag)
978-0-08-057760-9 (ISBN)

Infos

Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Inhalt

Front Cover 1
Advances in Imaging and Electron Physics, Volume 94 4
Copyright Page 5
Contents 6
Contributors 10
Preface 12
Chapter 1. Group Algebras in Signal and Image Processing 18
I. Introduction 19
II. Convolution by Sections 21
lll. Group Algebras 25
IV. Direct Product Group Algebras 31
V. Semidirect Product Group Algebras 36
VI. Inverses of Group Algebra Elements 39
VII. Matrix Transforms 44
VIII. Feature Detection Using Group Algebras 61
IX. The GRASP Class Library 72
X. GRASP Class Library Source Code 80
References 95
Chapter 2. Mirror Electron Microscopy 98
l. Introduction 98
ll. Principles of Mirror Electron Microscopy 100
lll. Applications of the Mirror Electron Microscope 112
IV. Fundamentals of Quantitative Mirror Electron Microscopy 115
V. Quantitative Contrast Interpretation of One-Dimensional Electrical Distortion Fields 126
Vl. Quantitative Contrast Interpretation of One-Dimensional Magnetic Destortion Fields 131
VII. Quantitative Mirror Electron Microscopy, Example 1:Contrast Simulation of Magnetic Fringing Fields of Recorded Periodic Flux Reversals 136
VIII. Quantitative Mirror Electron Microscopy, Example 2:Investigation of Electrical Microfields of Rotational Metal-Insulator-Semiconductor Samples 141
IX. Concluding Remarks 161
References 162
Chapter 3. Rough Sets 168
I. Fundamentals of Rough Set Theory 169
Il. Rough Set Theory and Evidence Theory 188
lll. Some Applications of Rough Sets 199
IV. Conclusions 211
References 211
Chapter 4. Theoretical Concepts of Electron Holography 214
I. Introduction 214
ll. The Scattering Amplitude 217
lll. Image Formation in Transmission Electron Microscopy 220
IV. Off-Axis Holography in the Transmission Electron Microscope 230
V. Image Formation in Scanning Transmission Electron Microscopy 238
VI. Off-Axis Scanning Transmission Electron Microscope Holography 249
VII. Conclusion 269
Appendix: Fresnel Diffraction in Off-Axis Transmission Electron Microscope Holography 270
References 273
Chapter 5. Quantum Neural Computing 276
I. Introduction 277
ll. Turing Test Revisited 283
lll. Neural Network Models 289
IV. The Binding Problem and Learning 301
V. On Indivisible Phenomena 310
VI. On Quantum and Neural Computation 315
VII. Structure and Information 322
VIII. Concluding Remarks 326
References 327
Chapter 6. Signal Description: New Approaches, New Results 332
I. Introduction 332
ll. Theoretical Basis of the Structural Properties Method 344
lll. Generalized Phase Planes 364
IV. Applications 382
References 411
Index 414

Produkt-Details

• Erscheint lt. Verlag: 22.11.1995
• Mitarbeit: Herausgeber (Serie): Peter W. Hawkes, Tom Mulvey
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-057760-1 / 0080577601
• ISBN-13: 978-0-08-057760-9 / 9780080577609