Growth of Electron Microscopy (eBook)

eBook Download: PDF

1996 | 1. Auflage
885 Seiten
Elsevier Science (Verlag)
978-0-08-057762-3 (ISBN)

Infos

As a complement to The Beginnings of Electron Microscopy, Advances in Imaging and Electron Physics is pleased to present Volume 96, The Growth of Electron Microscopy. This comprehensive collection of articles surveys the accomplishments of various national groups that comprise the International Federation of Societies of Electron Microscopy (IFSEM).

Inhalt

Front Cover 1
Advances in Imaging and Electron Physics, Volume 96 4
Copyright Page 5
CONTENTS 6
CONTRIBUTORS 10
PREFACE 14
Prologue 20
Part I: IFSEM 34
Chapter 1.1 Early History of the International Federation of Societies for Electron Microscopy 36
Chapter 1.2 IFSEM 1995: Objectives, Organization, and Functions 54
Part II: Some Individual Societies 70
Chapter 2.1 Electron Microscopy in Australia 72
Chapter 2.2A The Austrian Society for Electron Microscopy 88
Chapter 2.2B Reminiscences of Walter Glaser 92
Chapter 2.3 Electron Microscopy in Belgium 100
Chapter 2.4 The History of Electron Microscopy in Canada 112
Chapter 2.5 Electron Microscopy in France 126
Chapter 2.5A Early Findings in the Life Science 126
Chapter 2.5B The Development for Physics and Materials Sciences 134
Chapter 2.6A The Early History of Electron Microscopy in Germany 164
Chapter 2.6B The History of the German Society for Electron Microscopy 182
Chapter 2.6C Electron Microscopy in the Former German Democratic Republic 204
Chapter 2.7 The Hungarian Group for Electron Microscopy 214
Chapter 2.8 Electron Microscopy in Italy 226
Chapter 2.9 The Growth of Electron Microscopy in Japan 250
Chapter 2.9A Introduction 250
Chapter 2.9B The 37th Subcommittee of the Japanese Society for the Promotion of Science, 1939–1947 260
Chapter 2.9C History of Electron Microscopes at Tohoku University 278
Chapter 2.9D Development of Electron Microscopes at Tokyo Imperial University 284
Chapter 2.9E Development of Electron Microscopes at the Electro technicaI Laboratory 290
Chapter 2.9F Early Electron Microscopes at Osaka University, 1934–1945 296
Chapter 2.10 Electron Microscopy in the Netherlands 304
Chapter 2.10A Earliest Developments 304
Chapter 2.10B Developments since the 1950s 320
Chapter 2.11 The Development of Electron Microscopy in Scandinavia 334
Chapter 2.12 Electron Microscopy in Southern Africa 356
Chapter 2.13 Highlights in the Development of Electron Microscopy in the United States: A Bibliography and Commentary of Published Accounts and EMSA Records 380
Part III: Highlights of the Ifsem Congresses 416
Chapter 3.1 Biology 418
Chapter 3.2 Materials Science 426
Chapter 3.3 Electron Optics 438
Part IV: Instrumental Developments 446
Chapter 4.1 The Story of European Commerical Electron Microscopes 448
Chapter 4.2 My Early Work on Convergent-Beam Electron Diffraction 618
Chapter 4.3 Atom Images and IFSEM Affairs in Kyoto, Osaka, and Okayama 630
Chapter 4.4 Reminiscences on the Origins of the Scanning Electron Microscope and the Electron Microprobe 668
Chapter 4.5 Electron Microscopes and Microscopy in Japan 686
Chapter 4.5A Electron Microscope Development at Hitachi in the 1940s 686
Chapter 4.5B Development of the Electron Microscope at JEOL 692
Chapter 4.5C Development and Application of Electron Microscopes, Model SM-1 Series, at Shimadzu Corporation 698
Chapter 4.5D Electron Microscope Research at the Toshiba Corporation 706
Chapter 4.5E Development of the Electron Microscope at Kyoto Imperial University Faculty of Medicine 712
Chapter 4.5F Instrumentation 718
Chapter 4.5G Application of Electron Microscopy to Biological Science 756
Chapter 4.5H Application of Electron Microscopy to Biological Science (Microbiology) 768
Chapter 4.5I Applications to Materials Science 782
Chapter 4.5J Specimen Preparation Techniques 806
Chapter 4.6 Towards Atomic Resolution 824
Chapter 4.7 The Construction of Commercial Electron Microscopes in China 838
Appendix. Conference Proceedings and Conference Abstracts 882
Index 908

Produkt-Details

• Erscheint lt. Verlag: 5.8.1996
• Mitarbeit: Herausgeber (Serie): Benjamin Kazan, Tom Mulvey; Chef-Herausgeber: Peter W. Hawkes
• Sprache: englisch
• Themenwelt: Sachbuch/Ratgeber
• Themenwelt: Mathematik / Informatik ► Informatik
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Optik
• Themenwelt: Technik ► Bauwesen
• Themenwelt: Technik ► Elektrotechnik / Energietechnik
• Themenwelt: Technik ► Maschinenbau
• ISBN-10: 0-08-057762-8 / 0080577628
• ISBN-13: 978-0-08-057762-3 / 9780080577623