X-Ray Microscopy and Spectromicroscopy
Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996
Seiten
1998
Springer Berlin (Hersteller)
978-3-540-63998-5 (ISBN)
Springer Berlin (Hersteller)
978-3-540-63998-5 (ISBN)
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This book gives a status report of the developing analytical technique of X-ray microscopy. The technique allows the highest resolution in electromagnetic-wave microscopy. In addition to the systematic treatment of this subject in the book a CD is included that presents the latest special results reported at the 1996 conference on X-ray microscopy. This book appeals to reseachers developing and/or using the new and important technique of X-ray microscopy. The subject is treated systematically in the book, which gives a status report on this analytical technique. The variety of applications is presented on the enclosed CD.
Summary:
X-Ray Microscopy Projects.- X-Ray Microscopy Applications.- Microspectroscopy and Spectromicroscopy.- X-Ray Optics.- X-Ray Sources.
| Zusatzinfo | 249 figs., 14 tabs., 1 CD-ROM |
|---|---|
| Sprache | englisch |
| Gewicht | 711 g |
| Einbandart | gebunden |
| Schlagworte | Röntgenstrahlenmikroskopie |
| ISBN-10 | 3-540-63998-5 / 3540639985 |
| ISBN-13 | 978-3-540-63998-5 / 9783540639985 |
| Zustand | Neuware |
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