Crystal Structure Determination
Seiten
1999
Springer Berlin (Hersteller)
978-3-540-65970-9 (ISBN)
Springer Berlin (Hersteller)
978-3-540-65970-9 (ISBN)
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This textbook gives a concise introduction to modern crystal structure determination, emphasizing both the crystallographic background and the successive practical steps. In the theoretical sections, more importance is attached to a good understanding, assisted by many figures, than to a rigorous mathematical treatment. The most important measuring techniques, including the use of modern area detectors, and the methods of data reduction, structure solution and refinement are discussed from a practical point of view. Special emphasis is put on the ability to recognize and avoid possible errors and traps, and to judge the quality of results.
TOC: Introduction.- Crystal Lattices.- The Geometry of X-Ray Diffraction.- The Reciprocal Lattice.- Structure Factors.- Crystal Symmetry.- Experimental Methods.- Structure Solution.- Structure Refinement.- Additional Topics.- Errors and Pitfalls.- Interpretation and Presentation of Results.- Crystallographic Databases.- Outline of a Crystal Structure Determination.- Worked Example of a Structure Determination.
TOC: Introduction.- Crystal Lattices.- The Geometry of X-Ray Diffraction.- The Reciprocal Lattice.- Structure Factors.- Crystal Symmetry.- Experimental Methods.- Structure Solution.- Structure Refinement.- Additional Topics.- Errors and Pitfalls.- Interpretation and Presentation of Results.- Crystallographic Databases.- Outline of a Crystal Structure Determination.- Worked Example of a Structure Determination.
| Übersetzer | R. O. Gould |
|---|---|
| Zusatzinfo | 102 figs., 16 tabs. |
| Sprache | englisch |
| Einbandart | Paperback |
| ISBN-10 | 3-540-65970-6 / 3540659706 |
| ISBN-13 | 978-3-540-65970-9 / 9783540659709 |
| Zustand | Neuware |
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