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Surface Analysis in Materials Sciences

XXII, 453 Seiten
1992
Springer Berlin (Hersteller)
978-3-540-53611-6 (ISBN)

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This detailed guide to the use of surface analysis methods in materials science consists of three parts: an introduction to the concepts of surface structure and composition, a technique section describing 14 surface methods and an applications section.

This detailed and up-to-date guide to the use of surface analysis methods in materials science consists of three parts: an extensive introduction to the concepts of surface structure and composition, a techniques section describing 14 surface methods and a separate section on applications. Each chapter is written by a specialist in the field. The surface methods described include SAM, XPS, SIMS and other ion beam methods, LEED/RHEED, RBS and NRA, FTIR, SEM, STM, UPS and magnetic methods. Among the areas of application discussed are adsorption, catalysis, coated steel surfaces, inorganic surfaces, semiconductor devices, thin film solar cells and high temperature oxidation. This detailed exposition aims to enable researchers to select and exploit the appropriate surface method for a given application.
Zusatzinfo 250 figs.
Sprache englisch
Gewicht 860 g
Einbandart gebunden
Schlagworte Springer Series in Surface Sciences; Vol 23
ISBN-10 3-540-53611-6 / 3540536116
ISBN-13 978-3-540-53611-6 / 9783540536116
Zustand Neuware
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