Structural Analysis of Point Defects in Solids
An Introduction to Multiple Resonance Spectroscopy
Seiten
1993
Springer Berlin (Hersteller)
978-3-540-53615-4 (ISBN)
Springer Berlin (Hersteller)
978-3-540-53615-4 (ISBN)
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Introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essential for applications to the determination of microscopic defect structures.
'Structural Analysis of Point Defects in Solids' introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy essential for applications to the determination of microscopic defect structures. Investigations of the microscopic and electronic structure, and also correlations with the magnetic properties of solids, require various multiple magnetic resonance methods, such as ENDOR and optically detected EPR or ENDOR. This book discusses experimental, technological and theoretical aspects of these techniques comprehensively, from a practical viewpoint, with many illustrative examples taken from semiconductors and other solids. The nonspecialist is informed about the potential of the different methods, while the researcher faced with the task of determining defect structures is provided with the necessary tools, together with much information on computer-aided methods of data analysis and the principles of modern spectrometer design.
| Reihe/Serie | Springer Series in Solid-State Sciences ; 43 |
|---|---|
| Zusatzinfo | 165 figs. |
| Sprache | englisch |
| Gewicht | 718 g |
| Einbandart | gebunden |
| Schlagworte | Electron Nuclear Double Resonance Spectroscopy (EN • Elektronenspektroskopie • Elektronenspinresonanz-Spektroskopie • Springer Series in Solid-state Sciences; Vol 43 |
| ISBN-10 | 3-540-53615-9 / 3540536159 |
| ISBN-13 | 978-3-540-53615-4 / 9783540536154 |
| Zustand | Neuware |
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