Blick ins Buch

Trapped Charged Particles and Fundamental Interactions

Habil Klaus Blaum, Frank Herfurth (Herausgeber)

Buch | Hardcover

VIII, 192 Seiten

2008 | 2008
Springer Berlin (Verlag)
978-3-540-77816-5 (ISBN)

Lese- und Medienproben

Blick ins Buch (midvox)

Artikel merken

The development of ion traps has spurred significant experimental activities able to link measurable quantities to the most fundamental aspects of physics. The first chapter sets the scene and motivates the use of ion traps with an in-depth survey of the low-energy electroweak sector of the standard model amenable to precision test. The next parts then introduce and review aspects of the theory, simulation and experimental implementation of such traps. Last but not least, two important applications, namely high resolution mass spectrometry in Penning traps and tests of fundamental physics - such as the CPT theorem - with trapped antiprotons are discussed. This volume bridges the gap between the graduate textbook and the research literature and will assist graduate students and newcomers to the field in quickly entering and mastering the subject matter.

Low-Energy Precision Tests of Electroweak Theory.- Principles of Ion Traps.- Simulations for Ion Traps Methods and Numerical Implementation.- Simulations for Ion Traps Buffer Gas Cooling.- Highly-charged ions and high-resolution mass spectrometry in a Penning trap.- Fundamental tests with trapped antiprotons.

Erscheint lt. Verlag	27.8.2008
Reihe/Serie	Lecture Notes in Physics
Zusatzinfo	VIII, 192 p. 125 illus.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	1030 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik
Schlagworte	antiprotons • CPT theorem • Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik • HC/Physik, Astronomie/Atomphysik, Kernphysik • highly-charged ions • ion traps • mass spectronomy • particles • Simulation
ISBN-10	3-540-77816-0 / 3540778160
ISBN-13	978-3-540-77816-5 / 9783540778165
Zustand	Neuware