X–Ray Spectrometry – Recent Technological Advances

Kouichi Tsuji, Jasna Injuk, René Van Grieken (Herausgeber)

Software / Digital Media

616 Seiten

2004
John Wiley & Sons Ltd (Hersteller)
978-0-470-02043-2 (ISBN)

Infos

X-Ray Spectrometry: Recent Technological Advances covers the latest developments and areas of research in the methodological and instrumental aspects of x-ray spectrometry. * Includes the most advanced and high-tech aspects of the chemical analysis techniques based on x-rays* Introduces new types of X-ray optics and X-ray detectors, covering history, principles, characteristics and future trends* Written by internationally recognized scientists, all of whom are eminent specialists in each of the sub-fields* Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors, Special Configurations, New Computerization Methods, New Applications This valuable book will assist all analytical chemists and other users of x-ray spectrometry to fully exploit the capabilities of this set of powerful analytical tools and to further expand applications in such fields as material and environmental sciences, medicine, toxicology, forensics, archaeometry and many others.

Autor

Kouichi Tsuji is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. Jasna Injuk is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley. Rene Van Grieken is the editor of X-Ray Spectrometry: Recent Technological Advances, published by Wiley.

Inhalt

Contributors. Preface. 1 Introduction. 1.1 Considering the Role of X-ray Spectrometry in Chemical Analysis and Outlining the Volume. 2 X-Ray Sources. 2.1 Micro X-ray Sources. 2.2 New Synchrotron Radiation Sources. 2.3 Laser-driven X-ray Sources. 3 X-Ray Optics. 3.1 Multilayers for Soft and Hard X-rays. 3.2 Single Capillaries X-ray Optics. 3.3 Polycapillary X-ray Optics. 3.4 Parabolic Compound Refractive X-ray Lenses. 4 X-Ray Detectors. 4.1 Semiconductor Detectors for (Imaging) X-ray Spectroscopy. 4.2 Gas Proportional Scintillation Counters for X-ray Spectrometry. 4.3 Superconducting Tunnel Junctions. 4.4 Cryogenic Microcalorimeters. 4.5 Position Sensitive Semiconductor Strip Detectors. 5 Special Configurations. 5.1 Grazing-incidence X-ray Spectrometry. 5.2 Grazing-exit X-ray Spectrometry. 5.3 Portable Equipment for X-ray Fluorescence Analysis. 5.4 Synchrotron Radiation for Microscopic X-ray Fluorescence Analysis. 5.5 High-energy X-ray Fluorescence. 5.6 Low-energy Electron Probe Microanalysis and Scanning Electron Microscopy. 5.7 Energy Dispersive X-ray Microanalysis in Scanning and Conventional Transmission Electron Microscopy. 5.8 X-Ray Absorption Techniques. 6 New Computerisation Methods. 6.1 Monte Carlo Simulation for X-ray Fluorescence Spectroscopy. 6.2 Spectrum Evaluation. 7 New Applications. 7.1 X-Ray Fluorescence Analysis in Medical Sciences. 7.2 Total Reflection X-ray Fluorescence for Semiconductors and Thin Films. 7.3 X-Ray Spectrometry in Archaeometry. 7.4 X-Ray Spectrometry in Forensic Research. 7.5 Speciation and Surface Analysis of Single Particles Using Electron-excited X-ray Emission Spectrometry. Index.

Produkt-Details

• Erscheint lt. Verlag: 9.6.2004
• Verlagsort: Chichester
• Sprache: englisch
• Maße: 197 x 252 mm
• Gewicht: 1462 g
• Themenwelt: Naturwissenschaften ► Chemie ► Analytische Chemie
• ISBN-10: 0-470-02043-1 / 0470020431
• ISBN-13: 978-0-470-02043-2 / 9780470020432
• Zustand: Neuware