Scanning Force Microscopy
With Applications to Electric, Magnetic and Atomic Forces
Seiten
1994
|
Revised edition
Oxford University Press Inc (Verlag)
978-0-19-509204-2 (ISBN)
Oxford University Press Inc (Verlag)
978-0-19-509204-2 (ISBN)
This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries.
This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries.
This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
PART ONE: LEVERS AND NOISE ; 1. Mechanical properties of levers ; 2. Resonance enhancement ; 3. Sources of noise ; PART TWO: SCANNING FORCE MICROSCOPES ; 4. Tunneling detection systems ; 5. Capacitance detection systems ; 6. Homodyne detection systems ; 7. Heterodyne detection systems ; 8. Laser-Diode feedback detection systems ; 9. Polarization detection systems ; 10. Deflection detection systems ; PART THREE: SCANNING FORCE MICROSCOPY ; 11. Electric force microscopy ; 12. Magnetic force microscopy ; 13. Atomic force microscopy ; References ; Index
| Erscheint lt. Verlag | 20.10.1994 |
|---|---|
| Reihe/Serie | Oxford Series in Optical and Imaging Sciences ; 5 |
| Zusatzinfo | halftones, line drawings, tables |
| Verlagsort | New York |
| Sprache | englisch |
| Maße | 162 x 241 mm |
| Gewicht | 679 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik |
| ISBN-10 | 0-19-509204-X / 019509204X |
| ISBN-13 | 978-0-19-509204-2 / 9780195092042 |
| Zustand | Neuware |
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