Introduction to Texture Analysis
CRC Press (Verlag)
978-1-032-18942-0 (ISBN)
Reflecting emerging methods and the evolution of the field, Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping keeps mathematics to a minimum in covering both traditional macrotexture analysis and more advanced electron-microscopy-based microtexture analysis. The authors integrate the two techniques and address the subsequent need for a more detailed explanation of philosophy, practice, and analysis associated with texture analysis. The book illustrates approaches to orientation measurement and interpretation and elucidates the fundamental principles on which measurements are based. Thoroughly updated, this Third Edition of a best-seller is a rare introductory-level guide to texture analysis.
Discusses terminology associated with orientations, texture, and their representation, as well as the diffraction of radiation, a phenomenon that is the basis for almost all texture analysis
Covers data acquisition, as well as representation and evaluation related to the well-established methods of macrotexture analysis
Updated to include experimental details of the latest transmission or scanning electron microscope-based techniques for microstructure analysis, including electron backscatter diffraction (EBSD)
Describes how microtexture data are evaluated and represented and emphasizes the advances in orientation microscopy and mapping, and advanced issues concerning crystallographic aspects of interfaces and connectivity
Offers new and innovative grain boundary descriptions and examples
This book is an ideal tool to help readers in the materials sciences develop a working understanding of the practice and applications of texture.
Olaf Engler is senior scientist of metallurgy at the Research and Development Center of Hydro Aluminium in Bonn, Germany. Prior to that, he was at the University of Technology in Aachen, Germany, and the Materials Science and Technology Division of Los Alamos National Laboratory in the United States. Since 2004, he has also been an adjunct professor for Texture and Crystal Plasticity at the NTNU Trondheim, Norway, and a member of the international committee of the International Conference on Texture of Materials (ICOTOM). Engler has more than 20 years of experience in analysis, interpretation, and modeling of the development of microstructure and texture during the thermomechanical processing of metallic materials and control of the resulting materials properties. Stefan Zaefferer is Group Leader, Microscopy and Diffraction, Max-Planck-Institut für Eisenforschung GmbH.
Part I: Fundamental Issues. 1. Introduction. 2. Descriptors of Orientation. 3. Application of Diffraction to Texture Analysis. Part II: Macrotexture Analysis. 4. Macrotexture Measurements. 5. Evaluation and Representation of Macrotexture Data. Part III: Microtexture Analysis. 6. Diffraction Techniques in TEM and SEM. 7. Procedures for Orientation Determination from Electron Diffraction Patterns. 8. Practice of Orientation Measurement and Orientation Microscopy. 9. Orientation Microscopy and Orientation Mapping. 10. Evaluation and Representation of Microtexture Data. 11. Crystallographic Analysis of Interfaces, Surfaces, and Connectivity. 12. Orientation Relationships between Phases and Texture Formation during Phase Transformations. 13. Synchrotron Radiation, Nondiffraction Techniques, and Comparisons between Methods. Appendices.
| Erscheinungsdatum | 29.02.2024 |
|---|---|
| Zusatzinfo | 3 Line drawings, color; 146 Line drawings, black and white; 35 Halftones, color; 99 Halftones, black and white; 38 Illustrations, color; 245 Illustrations, black and white |
| Verlagsort | London |
| Sprache | englisch |
| Maße | 156 x 234 mm |
| Gewicht | 957 g |
| Themenwelt | Naturwissenschaften ► Biologie |
| Naturwissenschaften ► Chemie ► Analytische Chemie | |
| Technik ► Maschinenbau | |
| Technik ► Umwelttechnik / Biotechnologie | |
| ISBN-10 | 1-032-18942-8 / 1032189428 |
| ISBN-13 | 978-1-032-18942-0 / 9781032189420 |
| Zustand | Neuware |
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