Microstructural Characterisation Techniques

Gunturi Venkata Sitarama Sastry (Autor)

Buch | Hardcover

242 Seiten

2022 | 1st ed. 2022
Springer Verlag, Singapore
978-981-19-3508-4 (ISBN)

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This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.

Prof. Gunturi Venkata Sitarama Sastry is former Professor, Department of Metallurgical Engineering and also Dean of Academic Affairs, IIT(BHU), Varanasi, India for a three year period. He began extensive use of transmission electron microscopy since his doctoral work on rapidly quenched aluminum alloys at IT-BHU, Varanasi. His research tools have been diverse microstructural characterization techniques with major emphasis on TEM. Most of his publications in high impact international Journals reﬂect this vast expertise in the ﬁeld. Several of his students beneﬁted from his courses on metallographic techniques taught at the Department of Metallurgical Engineering, IIT(BHU), Varanasi, India (formerly Institute of Technology, BHU). He also conducted many short-term courses on electron microscopy and associated techniques at various institutions and research laboratories. He headed the National Electron Microscopy Facility established at the Department for over ﬁve years and later worked for the augmentation of new facilities over there. The Electron Microscope Society of India recognized his contributions to the ﬁeld by bestowing upon him the ‘Lifetime Achievement Award 2017’.

Introduction.- Electromagnetic Waves and Electron Waves.- Fourier Analysis and Fourier Transformation.- Transmission Electron Microscope.- Electron Diffraction.- Optical Microscopy.- Transmission Electron Microscopy.- Lens-less Electron Microscopy

Erscheinungsdatum	07.10.2022
Reihe/Serie	Indian Institute of Metals Series
Zusatzinfo	60 Illustrations, color; 149 Illustrations, black and white; XIX, 242 p. 209 illus., 60 illus. in color.
Verlagsort	Singapore
Sprache	englisch
Maße	155 x 235 mm
Gewicht	613 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
Themenwelt	Technik ► Maschinenbau
ISBN-10	981-19-3508-4 / 9811935084
ISBN-13	978-981-19-3508-4 / 9789811935084
Zustand	Neuware