Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Chandra Shakher Pathak, Samir Kumar (Herausgeber)

Buch | Hardcover

274 Seiten

2022
IntechOpen (Verlag)
978-1-83968-229-2 (ISBN)

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This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Erscheinungsdatum	26.01.2022
Verlagsort	London
Sprache	englisch
Maße	180 x 260 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
ISBN-10	1-83968-229-9 / 1839682299
ISBN-13	978-1-83968-229-2 / 9781839682292
Zustand	Neuware