Advanced Computing in Electron Microscopy

Earl J. Kirkland (Autor)

Buch | Softcover

XII, 354 Seiten

2021 | 3rd ed. 2020
Springer International Publishing (Verlag)
978-3-030-33262-4 (ISBN)

Artikel merken

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

lt;p>Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.

Introduction.- The Transmission Electron Microscope.- Some Image Approximations.- Sampling and the Fast Fourier Transform.- Calculation of Images of Thin Specimens.- Theory of Calculation of Images of Thick Specimens.- Multislice Applications and Examples.- The Programss.- App. A: Plotting Transfer Functions.- App. B: The Fourier Projection Theorem.- App. C: Atomic Potentials and Scattering Factors.- App. D: The Inverse Problem.- App. E: Bilinear Interpolation.- App. F: 3D Perspective View.

Erscheinungsdatum	24.03.2021
Zusatzinfo	XII, 354 p. 146 illus., 8 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Gewicht	563 g
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Chemie ► Physikalische Chemie
	Naturwissenschaften ► Physik / Astronomie
Schlagworte	ABF imaging • Biological Microscopy • fast fourier projection theorem • Fast Fourier transform • Image Interpretation • multislice methods • Parallel Image Processing • scanning transmission electron microscope • theory of electron image formation • Transmission Electron Microscopy
ISBN-10	3-030-33262-4 / 3030332624
ISBN-13	978-3-030-33262-4 / 9783030332624
Zustand	Neuware