Deformation and Evolution of Life in Crystalline Materials
CRC Press (Verlag)
978-0-367-78002-9 (ISBN)
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This book walks you through the fundamental deformation and damage mechanisms. It lends the reader the key to open the doors into the maze of deformation/fracture phenomena under various loading conditions. Furthermore it provides the solution method to material engineering design and analysis problems, for those working in the aerospace, automotive or energy industries. The book introduces the integrated creep-fatigue theory (ICFT) that considers holistic damage evolution from surface/subsurface crack nucleation to propagation in coalescence with internally-distributed damage/discontinuities.
Dr. Xijia Wu is a Senior Research Officer of the National Research Council Canada, and also an adjunct professor at Carleton University. His major research is on deformation and life prediction modeling for high temperature materials. He serves various industrial clients as part of his official duty. He has published more than 150 papers in referred journals and conference proceedings and is recognized as a leading expert in this field. He has received many institutional and conference awards.
1. Crystal Structure and Dislocation Kinetics
2. Deformation Mechanisms
3. Physics of Material Damage
4. The Integrated Creep-Fatigue Theory
5. Creep
6. Low Cycle Fatigue
7. Thermomechanical Fatigue
8. High Cycle Fatigue
9. Microscopic Crack Nucleation and Growth
10. Macroscopic Crack Growth
11. Single Crystal Ni-Base Superalloys
12. Thermal Barrier Coatings
13. Ceramics Matrix Composites
14. Component—Level Life Cycle Management
Appendix A—Solving Dislocation Distributions for a ZSK Crack
Appendix B—Solving Dislocation Distributions for a BCS Crack
References
Erscheinungsdatum | 06.04.2021 |
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Verlagsort | London |
Sprache | englisch |
Maße | 156 x 234 mm |
Gewicht | 780 g |
Themenwelt | Naturwissenschaften ► Geowissenschaften ► Mineralogie / Paläontologie |
Technik ► Maschinenbau | |
ISBN-10 | 0-367-78002-X / 036778002X |
ISBN-13 | 978-0-367-78002-9 / 9780367780029 |
Zustand | Neuware |
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