Resolving locations of defects in superconducting transmon qubits
Seiten
2019
KIT Scientific Publishing (Verlag)
978-3-7315-0967-7 (ISBN)
KIT Scientific Publishing (Verlag)
978-3-7315-0967-7 (ISBN)
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
Despite tremendous progress of quantum computation with superconducting qubits, up-scaling for practical applications is hindered by decoherence and fluctuations induced by material defects. In this work, a qubit interface has been developed to study the microscopic nature of individual defects in a probe material. Further, a portable method has been developed to find locations of individual defects in ready-made qubit samples, which offers to test and improve micro-fabrication of qubits.
| Erscheint lt. Verlag | 9.12.2019 |
|---|---|
| Reihe/Serie | Experimental Condensed Matter Physics ; 27 |
| Zusatzinfo | graph. Darst. |
| Sprache | englisch |
| Maße | 170 x 240 mm |
| Gewicht | 335 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Schlagworte | Defektspektroskopie mitt elektrischer und elastisc • Defektspektroskopie mitt elektrischer und elastischer Felder • material defects and decoherence • Materialdefekte und Dekohärenz • Quanten Bits • Quantenrechner • quantum bit • Quantum Computing • spectroscopy of defects with dc-electric and elast • spectroscopy of defects with dc-electric and elastic fields • Transmon Qubit |
| ISBN-10 | 3-7315-0967-9 / 3731509679 |
| ISBN-13 | 978-3-7315-0967-7 / 9783731509677 |
| Zustand | Neuware |
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