Atomic Force Microscopy
Fundamental Concepts and Laboratory Investigations
Seiten
2019
CRC Press (Verlag)
978-0-367-37123-4 (ISBN)
CRC Press (Verlag)
978-0-367-37123-4 (ISBN)
- Titel z.Zt. nicht lieferbar
- Versandkostenfrei
- Auch auf Rechnung
- Artikel merken
This book focuses primarily on the atomic force microscope, and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester long, introductory course in atomic force microscopy.
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
This book focuses primarily on the atomic force microscope and serves as a reference for students, postdocs, and researchers using atomic force microscopes for the first time. In addition, this book can serve as the primary text for a semester-long introductory course in atomic force microscopy. There are a few algebra-based mathematical relationships included in the book that describe the mechanical properties, behaviors, and intermolecular forces associated with probes used in atomic force microscopy. Relevant figures, tables, and illustrations also appear in each chapter in an effort to provide additional information and points of interest. This book includes suggested laboratory investigations that provide opportunities to explore the versatility of the atomic force microscope. These laboratory exercises include opportunities for experimenters to explore force curves, surface roughness, friction loops, conductivity imaging, and phase imaging.
Wesley C. Sanders is currently an assistant professor at Salt Lake Community College. He teaches courses in nanotechnology, materials science, chemistry, and microscopy. While serving as an assistant professor, he has published articles in the Journal of Chemical Education describing undergraduate labs for use in introductory, nanotechnology courses.
1. Introduction to Atomic Force Microscopy 2. Tip-Sample Forces 3. AFM Electronics 4. AFM Cantilevers and Probes 5. Contact Mode AFM 6. Lateral Force Microscopy 7. Conductive Atomic Force Microscopy 8. Oscillating Modes of AFM 9. Image Processing
| Erscheinungsdatum | 24.10.2019 |
|---|---|
| Zusatzinfo | 9 Tables, black and white; 89 Illustrations, black and white |
| Verlagsort | London |
| Sprache | englisch |
| Maße | 156 x 234 mm |
| Gewicht | 380 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
| Technik ► Elektrotechnik / Energietechnik | |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-367-37123-5 / 0367371235 |
| ISBN-13 | 978-0-367-37123-4 / 9780367371234 |
| Zustand | Neuware |
| Haben Sie eine Frage zum Produkt? |
Mehr entdecken
aus dem Bereich
aus dem Bereich
Grundlagen - Verfahren - Anwendungen - Beispiele
Buch | Hardcover (2022)
Hanser, Carl (Verlag)
CHF 69,95
Grundlagen und Anwendungen
Buch | Hardcover (2023)
Hanser, Carl (Verlag)
CHF 83,95
