Handbook of Materials Characterization (eBook)

Surender Kumar Sharma (Herausgeber)

eBook Download: PDF

2018 | 1st ed. 2018
VIII, 613 Seiten
Springer International Publishing (Verlag)
978-3-319-92955-2 (ISBN)

Infos

This book focuses on the widely used experimental techniques available for the structural, morphological, and spectroscopic characterization of materials. Recent developments in a wide range of experimental techniques and their application to the quantification of materials properties are an essential side of this book. Moreover, it provides concise but thorough coverage of the practical and theoretical aspects of the analytical techniques used to characterize a wide variety of functional nanomaterials. The book provides an overview of widely used characterization techniques for a broad audience: from beginners and graduate students, to advanced specialists in both academia and industry.

Prof. Dr. Surender Kumar Sharma has obtained his PhD in July 2007 from Himachal Pradesh University, Shimla India. After spending several years in research/academic positions in Brazil, France, Czech Republic, India and Mexico working in the area of nanomagnetism and functional nanomaterials, he has joined Federal University of Maranhão, Brazil, as a Professor of the Department of Physics, where he stands since February 2015. Currently he is an active member of the Graduate research program at UFMA and actively involved in research, teaching and supervising research students at UG/G levels. He has been awarded as FAPEMA Senior Researcher award in August 2015. To date, Dr. Sharma has published more than 70 research articles in reputed journals, 3 books as a single author and 3 book chapters.

Dr. Dalip Singh Verma obtained his PhD in Physics in 2008 from Panjab University, India. During his PhD, he spent a few months at Frankfurt Institute of Advance Studies, Germany, as part of his PhD thesis. Later, he served as an Assistant Professor in Physics at Government College for Girls, Sector-11 Chandigarh and Government College Bassa, District Mandi (H.P.) India. Since 2012, he is working as an Assistant Professor in Physics at Department of Physics & Astronomical Sciences, Central University of Himachal Pradesh, Dharamshala, Kangra (H.P.)-India.

Dr. Latif Ullah Khan has obtained his PhD in Inorganic Chemistry (2015) from Institute of Chemistry, University of São Paulo, Brazil. Currently, he is working as a researcher (postdoc) at Brazilian Nanotechnology National Laboratory (LNNano), CNPEM, Campinas-SP, Brazil. His research interests include design and characterization of optical and magnetic nanomaterials as well as their toxicity assessment in zebrafish and c. elegans models using m-XRF images, in correlation with Cytoviva hyperspectral images and confocal laser microscope images. In addition, application of these nanomaterials for the development of multifunctional nanoprobes for early detection of complex diseases such as cancer He also studies the photoluminescence and electronic spectroscopy of rare earth materials for application in development of solid-state white light- emitting diodes (WLEDs). 

Dr. Shalendra Kumar is currently working as Assistant Professor at the Department of Applied Physics, Amity School of Applied Sciences, Amity University Haryana, Gurgaon, India, since August 2016. Dr. Kumar obtained his Ph.D. in Physics from AMU, Aligarh. After completion of Ph.D., he worked as a fellow of Korean Research Foundation (KRF), from February 2008 to March 2009 and Research Professor under the Brain Pool Program of South Korean Federation of Science and Technology from April 2009 to January 2012, at Changwon National University, South Korea. In February 2012, he joined the Beam line Division, Pohang Light Source II as a Research Scientist till April 2013. Dr. Kumar also worked as an Assistant Professor, at Department of Physics, National Institute of Technology, India, from August 2013 to November 2013. Again from December 2013 to July 2015, he worked as a Research Professor at Changwon National University, Republic of Korea. Dr. Kumar also served as visiting Professor at Department of Physics, Federal University of Maranhão, Brazil, from December 2015 to May 2016. Dr. Kumar has published more than 140 research papers in international peer-reviewed journals.

Prof. Dr. Sher Bahadar Khan obtained his Ph.D. from HEJ, Karachi University, Pakistan. After completion of Ph.D, he started his post-doctoral career in Nanochemistry and Nanotechnology and continued to work as a post-doctoral research fellow until February 2010 at Yonsei University, South Korea. In March 2010, he joined the Center for Advanced Materials and Nano-engineering, Department of Chemistry, Najran University, as an Assistant Professor and continued his work until 31^st August 2011. Currently he is an Assistant Professor in the Chemistry Department, King Abdulaziz University, Saudi Arabia, since September 2011. He is the author of several research papers, books, and patents with more than 2800 citations and 32 h-index.

Inhalt

Chapter 1: X-Ray diffraction from polycrystalline materials: techniques and applications 1. Introduction 2. Basic properties and background of X-rays 3. Principles of crystals symmetry     3.1. Crystal Types             3.1.1 Ideal Crystal             3.1.2 Real Crystal  4. Elements of X-ray diffraction     4.1. Interaction of electromagnetic waves and atoms     4.2. Concept of Reciprocal Space     4.3. Diffraction from Periodic Structures     4.4. Bragg´s law     4.5. Laue´s Equation & Ewald sphere     4.6. Structure factor     4.7. Diffraction by crystalline aggregates 5. Instrumentation      5.1. Various components      5.2. Characterization by XRD      5.3. Types of Scan      5.4 Sample loading and unloading      5.5 Software for XRD patterns analysis 6. Analysis of XRD data 7. Basics Concepts of Rietveld Method 8. Crystals Size and strain calculations 9. Phases quantifying 10. Summary 11. References   Chapter 2: TEM for atomic scale studies: fundamentals, instrumentation and applications in nanotechnology 1. Introduction      1.1. TEM Overview      1.2. TEM-What can we do?      1.3. Historical development of modern TEM 2. Basic Background and Principle      2.1. Light versus Electron Microscope      2.2. Resolution and its limitations      2.3. Electron Properties 2.4. Advancement in Electron Microscopy 2.5. Imaging and micro-analysis 2.6. High Resolution Imaging 3. Instrumentation      3.1. Basic layout & components             3.1.1. Electron Source             3.1.2.  Electromagnetic lenses             3.1.3. Vacuum System             3.1.4. Electron Detectors             3.1.5. Other Components (Apertures)             3.1.6. TEM cross-sectional  Model      3.2. Functioning and operational Procedures      3.3. Sample Preparation             3.3.1. Basic criterion for successful TEM sample preparation             3.3.2. Preparation method                        3.3.2.1. Nanoparticles                        3.3.2.2. Bulk                        3.3.2.3. Layered structures                   3.3.2.4. Thin Films             3.3.3. Artifacts Elimination 4. Imaging and Spectroscopy: a brief overview      4.1. High resolution TEM imaging      4.2. Electron diffraction             4.2.1. Low Energy Electron Diffraction (LEED)             4.2.2. Reflection High Energy Electron Diffraction (RHEED)      4.3. Chemical Mapping      4.4. Electron energy loss spectroscopy 5. Data Processing and software 6. Future prospects 5. Acknowledgment 6. References   Chapter 3: Importance of scanning electron microscopy in the morphological characterization of nanomaterials 1. Introduction      1.1. Scanning Electron Microscopy      1.2. Importance of Scanning Electron Microscopy      1.3. Basic Principle      1.4. Advancement in Scanning Electron Microscopy 1.5. Imaging and micro-analysis 1.6. Electron Diffraction Analysis 2. Instrumentation      2.1. Basic layout      2.2. Functioning and operation 2.3. Sample Preparation & staining 2.4. Artifacts Elimination 3. Application of scanning electron microscopy in materials science      3.1. Nanomaterials             3.1.1. Nanowires             3.1.2. Quantum Dots 4. Summary 5. Acknowledgment 6. References   Chapter 4: Scanning force microscopy: basic concept, instrumentation and applications 1. Introduction to Scanning Force Microscopy      1.1. Atomic Force Microscopy             1.1.1. History and background of AFM             1.1.2. Basic component of an AFM                        1.1.2.1. General components and their functions             1.1.3. Tip-Sample interactions and feedback mechanism             1.1.4. Atomic force and different scanning modes             1.1.5. AFM tip and resolution      1.2. Two special modes of AFM             1.2.1. Magnetic Force Microscopy                       1.2.1.1. Dual Scanning                       1.2.1.2. Advantages of MFM imaging             1.2.2. Electrostatic Force Microscopy 2. Experimental Details      2.1. Thin film deposition of Co on Si      2.2. Characterization performed 3. Results and Discussion      3.1. Data analysis      3.2. Application in nano and hybrids composites 4. Summary 5. References   Chapter 5: Characterization of nanomaterials using dynamic light scattering: basic concept and applications 1. Introduction                         2. Basic concept of light scattering      2.1. Interaction of light with Matter      2.2. Total intensity light scattering 3. Dynamic Light Scattering      3.1. Characterization using dynamic light scattering              3.3.1. Particle size              3.3.2. Particle Electrostatics              3.3.3. Zeta potential      3.2. Theory 4. Experimental      4.1. Instrumentation      4.2. Data analysis methods for DLS measurements 5. Future prospects 6. Acknowledgment 7. References

Produkt-Details

• Erscheint lt. Verlag: 18.9.2018
• Co-Autor: Dalip Singh Verma, Latif Ullah Khan, Shalendra Kumar, Sher Bahadar Khan
• Zusatzinfo: VIII, 613 p. 287 illus., 217 illus. in color.
• Verlagsort: Cham
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie
• Themenwelt: Naturwissenschaften ► Physik / Astronomie
• Themenwelt: Technik ► Maschinenbau
• Schlagworte: Dielectric and Impedance Spectroscopy • Dynamic Light Scattering • electron microscopy • Mössbauer spectroscopy • Optical absorption spectroscopy • Photoluminescence and electronic Spectroscopy • Scanning Force Microscopy • X-ray absorption spectroscopy • X-ray Diffraction (XRD) methods
• ISBN-10: 3-319-92955-0 / 3319929550
• ISBN-13: 978-3-319-92955-2 / 9783319929552