Immittance Spectroscopy – Applications to Material Systems
John Wiley & Sons Inc (Hersteller)
978-1-119-18541-3 (ISBN)
- Keine Verlagsinformationen verfügbar
- Artikel merken
This book addresses the following highlighted contents for the measured data but not limited to the: -
(1) Lumped Parameter/Complex Plane Analysis (LP/CPA) in conjunction with the Bode plots;
(2) Equivalent circuit model (ECM) derived from the LP/CPA;
(3) Underlying Operative Mechanisms along with the possible interpretations;
(4) Ideal (Debye) and non-ideal (non-Debye) relaxations; and
(5) Data-Handling Criteria (DHC) using Complex Nonlinear Least Squares (CNLS) fitting procedures.
Mohammad A. Alim is a Professor in the Department of Electrical Engineering & Computer Science at Alabama A & M University (AAMU) where he joined as one of the founding faculty members in August 1998. He earned MS in Physics and PhD in Electrical Engineering & Computer Science from Marquette University in 1980 and 1986, respectively. Dr. Alim is a single-handed pioneering developer of the concurrent multiple complex plane analysis of the measured ac small-signal electrical data. His approach demonstrated lumped-parameter/complex-plane-analysis employing complex nonlinear least squares (CNLS) fitting using Levenberg-Marquardt algorithm. The achievement of the frequency-independent dielectric behavior for the polycrystalline varistors was a milestone. This outstanding work has been highly cited for a variety of complicated material systems. Thus, the immittance (impedance or admittance) spectroscopy turned to a powerful non-destructive tool in delineating underlying operative competing phenomena in a variety of material systems and devices. Most recently Dr. Alim had been instrumental in developing collaboratively MATLAB based CNLS curve fitting. His long time exposure in experiments with the state-of-the-art instruments and knowledge in supervision and maintenance is the asset for the semiconductor measurements and reverse engineering curricula. He possesses 100+ publications comprising of co-edited books, book chapters, NASA Technical Memorandum, peer reviewed journal papers, U.S. patents, and conference proceedings/abstracts, etc. beside international seminars.
Erscheint lt. Verlag | 22.12.2017 |
---|---|
Verlagsort | New York |
Sprache | englisch |
Maße | 150 x 250 mm |
Gewicht | 666 g |
Themenwelt | Naturwissenschaften ► Chemie ► Analytische Chemie |
Naturwissenschaften ► Chemie ► Physikalische Chemie | |
ISBN-10 | 1-119-18541-6 / 1119185416 |
ISBN-13 | 978-1-119-18541-3 / 9781119185413 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |