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Rietveld Refinement

Practical Powder Diffraction Pattern Analysis using TOPAS
Buch | Softcover
XVI, 331 Seiten
2018
De Gruyter (Verlag)
978-3-11-045621-9 (ISBN)

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Rietveld Refinement - Robert E. Dinnebier, Andreas Leineweber, John S.O. Evans
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Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use. This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.

Robert Dinnebier, MPI for Solid State Res., Ger.; Andreas Leineweber, TU Bergakademie Freiberg, Ger.; John S.O. Evans, Durham Univ., UK.

- Basics of powder diffraction
- The Rietveld formula
- Whole Powder Pattern Fitting (Pawley, LeBail, Rietveld)
- Concept of Convolution
- Deriving the instrumental resolution function
- Global versus local optimization
- Structure determination
- Fourier analysis
- Isotropic and anisotropic microstructural properties
- Rigid bodies, constraints, restraints
- Sequential versus parametric Rietveld refinement
- Symmetry and rotational modes
- Modelling stacking faults
- Quantitative phase analysis
- Determination of amorphous content
- Agreement factors
- Macro programming

"Dinnebier, Leineweber and Evans have done an outstanding job of explaining the fundamentals of the method and summarizing the exciting new developments. With this book, the reader can find answers to two questions: what information is stored in a powder diffraction pattern, and how to extract that information using TOPAS. I particularly like this combination of theory and practice and I wholeheartedly recommend this excellent read to any user of the powder diffraction method."
Tomce Runcevski in: Journal of Applied Crystallography 52 (2019), https://doi.org/10.1107/S1600576719011178

Erscheinungsdatum
Reihe/Serie De Gruyter STEM
Zusatzinfo 20 b/w and 10 col. ill.
Verlagsort Berlin/Boston
Sprache englisch
Maße 170 x 240 mm
Gewicht 655 g
Themenwelt Naturwissenschaften Physik / Astronomie Festkörperphysik
Schlagworte Agricultural • biodiversity • Condensed Matter • Condensed matter physics • earth sciences • Gheler-Costa • Landscapes • Physics • Physik, Astronomie • Science • Textbook
ISBN-10 3-11-045621-4 / 3110456214
ISBN-13 978-3-11-045621-9 / 9783110456219
Zustand Neuware
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