Surface Analysis
John Wiley & Sons Ltd (Verlag)
978-0-471-95939-7 (ISBN)
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This work examines the characterization and understanding of the outer layers of substrates. How they react, look and function are all of interest to the surface scientist. For example, the paint industry uses surface science to ensure that paints produced do not react in an adverse way with the surfaces they are designed to cover. From the basic principles of surface analysis, this text considers the various techniques used to analyze surfaces and the theory required to understand the results. The book begins with a general introduction to the sometimes complex area of surface analysis, and continues with chapters by leading experts on the different techniques currently used, including SIMS, ESCA, Auger and vibrational spectroscopy. Anyone with a basic understanding of the subject should discover the rudiments of any particular technique and the answers to commonly asked questions. Despite being prepared as an undergraduate text, researchers in the areas of polymer and materials chemistry, coatings, semiconductors, ceramics, membrane chemistry, electronics and nanotechnology should still find this a useful book for reference.
Vacuum Technology - Rod Wilson; (Explanation of principles and terminology, vacuum pumps, pressure measurement). Electron Spectroscopy for Chemical Analysis - Buddy Ratner and David Caster; (Overview of ESCA, x-ray interaction, binding energy and the chemical shift, IMFP and sampling depth, quantification, spectral features, instrumentation, spectral quality, depth profiling). Auger Electron Spectroscopy - H-J Mathieu;(Auger Process, sources of AES, chemical effects in AES, Scanning Auger Microscopy, Auger Depth Profiling, Instrumentation, Applications, Secondary Ion Mass Spectrometry - the Surface) Mass Spectrometry - J C Vickerman and A J Swift, Low Energy Ion Scattering and Rutherford Backscattering - E. Taglauer, Vibrational Spectroscopy - M Pemble; (Electron Energy Loss Spectroscopy) (EELS), Raman Scattering, IR Spectroscopy) Surface Structure Determination by Interference Techniques - Wendy Flavell, (electron diffraction techniques, low energy electron diffraction) (LEED), Reflection High Energy Electron Diffraction (RHEED) Scanning Tunelling Microscopy and Atomic Force Microscopy - Graham Leggett.
| Erscheint lt. Verlag | 25.7.1997 |
|---|---|
| Zusatzinfo | Illustrations |
| Verlagsort | Chichester |
| Sprache | englisch |
| Maße | 156 x 235 mm |
| Gewicht | 800 g |
| Themenwelt | Naturwissenschaften ► Chemie ► Physikalische Chemie |
| Technik ► Maschinenbau | |
| ISBN-10 | 0-471-95939-1 / 0471959391 |
| ISBN-13 | 978-0-471-95939-7 / 9780471959397 |
| Zustand | Neuware |
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