Scanning Probe Microscopy

Electrical and Electromechanical Phenomena at the Nanoscale

Sergei V. Kalinin, Alexei Gruverman (Autoren)

Buch | Softcover

980 Seiten

2016 | Softcover reprint of the original 1st ed. 2007
Springer-Verlag New York Inc.
978-1-4939-5036-2 (ISBN)

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Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

SPM Techniques for Electrical Characterization.- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport.- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy.- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics.- Principles of Kelvin Probe Force Microscopy.- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy.- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy.- Principles of Near-Field Microwave Microscopy.- Electromagnetic Singularities and Resonances in Near-Field Optical Probes.- Electrochemical SPM.- Near-Field High-Frequency Probing.- Electrical and Electromechanical Imaging at the Limits of Resolution.- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III–V Semiconductors.- Spin-Polarized Scanning Tunneling Microscopy.- Scanning Probe Measurements of Electron Transport in Molecules.- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices.- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks.- Theory of Scanning Probe Microscopy.- Multi-Probe Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy in Vacuum.- Scanning Tunneling Microscopy and Spectroscopy of Manganites.- Electrical SPM Characterization of Materials and Devices.- Scanning Voltage Microscopy.- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces.- Electromechanical Behavior in Biological Systems at the Nanoscale.- Scanning Capacitance Microscopy.- Kelvin Probe Force Microscopy of Semiconductors.- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy.- Electron Flow Through MolecularStructures.- Electrical Characterization of Perovskite Nanostructures by SPM.- SPM Measurements of Electric Properties of Organic Molecules.- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices.- Electrical Nanofabrication.- Electrical SPM-Based Nanofabrication Techniques.- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation.- UHV-STM Nanofabrication on Silicon.- Ferroelectric Lithography.- Patterned Self-Assembled Monolayers via Scanning Probe Lithography.- Resistive Probe Storage: Read/Write Mechanism.

Erscheinungsdatum	23.11.2016
Zusatzinfo	16 Illustrations, color; 13 Illustrations, black and white; XXXVIII, 980 p. 29 illus., 16 illus. in color. In 2 volumes, not available separately.
Verlagsort	New York
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Biologie
	Naturwissenschaften ► Chemie ► Analytische Chemie
	Technik ► Maschinenbau
Schlagworte	AFM • Carbon Nanotubes • Electronics • KLTcatalog • Mechanics • Microscopy • Nanotube • PED • Polymer • Polymers • REM • spectroscopy • stem • STM • Ultrasound
ISBN-10	1-4939-5036-3 / 1493950363
ISBN-13	978-1-4939-5036-2 / 9781493950362
Zustand	Neuware