Noncontact Atomic Force Microscopy

Volume 3

Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger (Herausgeber)

Buch | Softcover

XXII, 527 Seiten

2016 | 1. Softcover reprint of the original 1st ed. 2015
Springer International Publishing (Verlag)
978-3-319-35876-5 (ISBN)

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This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.

From the Contents: Introduction.- 3D Force-Field Spectroscopy.- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts.- Spectroscopy and Manipulation Using AFM/STM at Room Temperature.- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy.- Non-Contact Friction.- Magnetic Exchange Force Spectroscopy.

Erscheinungsdatum	21.10.2016
Reihe/Serie	NanoScience and Technology
Zusatzinfo	XXII, 527 p. 256 illus., 159 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Technik
Schlagworte	Atomic force microscopy • Atomic/Molecular Manipulation • atomic resolution • Atom manipulation • chemical structure • Chemistry and Materials Science • Force Mapping with Atomic Resolution • Liquid AFM • Magnetic Exchange Force Microscopy • Materials Science • nanoscale science and technology • nanotechnology • Physics • scanning probe techniques • Scanning Tunneling Microscopy • Scientific equipment, experiments and techniques • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Surface chemistry and adsorption • Surfaces and Interfaces, Thin Films
ISBN-10	3-319-35876-6 / 3319358766
ISBN-13	978-3-319-35876-5 / 9783319358765
Zustand	Neuware