Introduction to Quantum Metrology

Quantum Standards and Instrumentation

Waldemar Nawrocki (Autor)

Buch | Softcover

XIII, 279 Seiten

2016 | 1. Softcover reprint of the original 1st ed. 2015
Springer International Publishing (Verlag)
978-3-319-38479-5 (ISBN)

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This book presents the theory of quantum effects used in metrology and results of the author's own research in the field of quantum electronics. The book provides also quantum measurement standards used in many branches of metrology for electrical quantities, mass, length, time and frequency. This book represents the first comprehensive survey of quantum metrology problems. As a scientific survey, it propagates a new approach to metrology with more emphasis on its connection with physics. This is of importance for the constantly developing technologies and nanotechnologies in particular. Providing a presentation of practical applications of the effects used in quantum metrology for the construction of quantum standards and sensitive electronic components, the book is useful for a wide audience of physicists and metrologists in the broad sense of both terms. In 2014 a new system of units, the so called Quantum SI, is introduced. This book helps to understand and approve the new system to both technology and academic community.

Theoretical Background of Quantum Metrology.- Measures, Standards and Systems of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling and Possible Current Standard.- Atomic Clocks and Time Scales.- Interferometers and Measurements of Length.- Scanning Probe Microscopes.- Other Quantum Detectors.- Standards of the Kilogram Based on Fundamental Physical Constants.

Erscheinungsdatum	14.10.2016
Zusatzinfo	XIII, 279 p. 134 illus., 23 illus. in color.
Verlagsort	Cham
Sprache	englisch
Original-Titel	Wstep do metrologii kwantowej
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften
Themenwelt	Technik
Schlagworte	Atomic Clocks and Time Scales • Electronics and Microelectronics, Instrumentation • Electronics engineering • High Accuracy Measurements • High Resolution Measurements • Interferometers and Measurements of Length • Measurement Science and Instrumentation • Measures and Standards • nanoscale science and technology • nanotechnology • Nanotechnology and Microengineering • other manufacturing technologies • Physics • Physics and Astronomy • quantum metrology • Quantum Standards • Scientific standards, measurement etc • System of Units
ISBN-10	3-319-38479-1 / 3319384791
ISBN-13	978-3-319-38479-5 / 9783319384795
Zustand	Neuware