Critical Phenomena at Surfaces and Interfaces
Evanescent X-Ray and Neutron Scattering
Seiten
1992
Springer Berlin (Hersteller)
9783540545347 (ISBN)
Springer Berlin (Hersteller)
9783540545347 (ISBN)
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This volume treats the scattering of evanascent X-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.
| Zusatzinfo | 69 figs. |
|---|---|
| Verlagsort | Berlin |
| Sprache | englisch |
| Gewicht | 370 g |
| Einbandart | gebunden |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik |
| ISBN-13 | 9783540545347 / 9783540545347 |
| Zustand | Neuware |
| Informationen gemäß Produktsicherheitsverordnung (GPSR) | |
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