Ferroelectric Domain Walls

Statics, Dynamics, and Functionalities Revealed by Atomic Force Microscopy

Jill Guyonnet (Autor)

Buch | Softcover

XV, 159 Seiten

2016 | 1. Softcover reprint of the original 1st ed. 2014
Springer International Publishing (Verlag)
978-3-319-38277-7 (ISBN)

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Using the nano metric resolution of atomic force microscopy techniques, this work explores the rich fundamental physics and novel functionalities of domain walls in ferroelectric materials, the nano scale interfaces separating regions of differently oriented spontaneous polarization. Due to the local symmetry-breaking caused by the change in polarization, domain walls are found to possess an unexpected lateral piezoelectric response, even when this is symmetry-forbidden in the parent material. This has interesting potential applications in electromechanical devices based on ferroelectric domain patterning. Moreover, electrical conduction is shown to arise at domain walls in otherwise insulating lead zirconate titanate, the first such observation outside of multiferroic bismuth ferrite, due to the tendency of the walls to localize defects. The role of defects is then explored in the theoretical framework of disordered elastic interfaces possessing a characteristic roughness scaling and complex dynamic response. It is shown that the heterogeneous disorder landscape in ferroelectric thin films leads to a breakdown of the usual self-affine roughness, possibly related to strong pinning at individual defects. Finally, the roles of varying environmental conditions and defect densities in domain switching are explored and shown to be adequately modelled as a competition between screening effects and pinning.

Introduction.- Domain Walls in Ferroelectric Materials.- Experimental Setup.- Lateral Piezoelectric Response Across Ferroelectric Domain Walls.- Electrical Conduction at 180° Ferroelectric Domain Walls.- A Statistical Approach to Domain Wall Roughening and Dynamics: Disordered Elastic Systems.- Measuring the Roughness Exponent of One-Dimensional Interfaces.- Roughness Analysis of 180° Ferroelectric Domain Walls.- Disorder and Environmental Effects on Nanodomain Growth.- Conclusions.- Appendix A Displacement Autocorrelation Function Scaling for Super-Rough Interfaces.- Appendix B AFM for the Eye.

Erscheinungsdatum	15.09.2016
Reihe/Serie	Springer Theses
Zusatzinfo	XV, 159 p. 96 illus., 17 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Naturwissenschaften ► Physik / Astronomie ► Theoretische Physik
Schlagworte	Atomic force microscopy • Characteristic Roughness Scaling • Condensed matter physics (liquid state and solid s • Defect Localization at Domain Walls • Disordered Elastic Interfaces • Domain Engineering • Electronic devices and materials • Ferroelectric Domain Patterning • Ferroelectric Domains • Ferroelectric thin films • Lateral Piezoelectric Response • nanoscale science and technology • nanotechnology • optical and electronic materials • Physics and Astronomy • Piezoresponse Force Microscopy • Scientific equipment, experiments and techniques • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Surface and Interface Science, Thin Films
ISBN-10	3-319-38277-2 / 3319382772
ISBN-13	978-3-319-38277-7 / 9783319382777
Zustand	Neuware