Laboratory Micro-X-Ray Fluorescence Spectroscopy

Instrumentation and Applications

Michael Haschke (Autor)

Buch | Softcover

XVIII, 356 Seiten

2016 | 1. Softcover reprint of the original 1st ed. 2014
Springer International Publishing (Verlag)
978-3-319-35302-9 (ISBN)

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Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.

Michael Haschke was born 1948, his schooling was combined with teachings for metalworker. After the study of physics at the TU Dresden which was finished 1974 with PhD he started his career – at first in the Academy of Science of GDR, branch for scientific instrumentation and then in different companies. From the beginning of the 80th he was working in the field of X-Ray analytics. During that time he was responsible for the introduction of energy-dispersive X-Ray spectrometers (EDS) in GDR, for the buildup of the X-Ray product line in Spectro, Kleve including the excitation with polarized radiation, the use of small spectrometers for jewelry analysis and the introduction of poly-capillary based instruments for µ-XRF in Röntgenanalytik Messtechnik GmbH, Taunusstein in close cooperation with EDAX, USA, the use of µ-XRF as an additional excitation source for electron microscopes in IfG, Berlin and finally for the introduction of a complete product line for µ-XRF in Bruker Nano, GmbH, Berlin. This responsibility was realized as deputy-director or product manager in the different companies. He understood the introduction of new instruments as a combination of the development of the instruments with the introduction into the market. Therefore there is a big experience both for instrumentation as well as for application.

XRF-Basics.- Main Components of X-Ray Spectrometers.- Special Requirements for µ-XRF.- Quantification.- Sample Preparation.- Relations to Other Analytical Methods.- Applications.

Erscheinungsdatum	29.08.2016
Reihe/Serie	Springer Series in Surface Sciences
Zusatzinfo	XVIII, 356 p. 254 illus., 107 illus. in color.
Verlagsort	Cham
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Chemie ► Physikalische Chemie
	Naturwissenschaften ► Physik / Astronomie
Schlagworte	Components of X-ray Spectrometers • Condensed matter physics (liquid state and solid s • Distribution Analysis • Examination of Bulk Samples and Layer Systems • Materials Science • Measurement Science and Instrumentation • Micro-X-ray Fluorescence • Non-destructive analysis • Physics and Astronomy • Scientific equipment, experiments and techniques • Scientific standards, measurement etc • Single Point, Multi-dimensional and • Spatial Resolved Element Analysis • Spectroscopy and Microscopy • Spectroscopy/Spectrometry • Spectrum analysis, spectrochemistry, mass spectrom • Surface and Interface Science, Thin Films • Surface chemistry and adsorption • Surfaces and Interfaces, Thin Films • X-ray spectrometers
ISBN-10	3-319-35302-0 / 3319353020
ISBN-13	978-3-319-35302-9 / 9783319353029
Zustand	Neuware