X-Ray Absorption Spectroscopy of Semiconductors

Claudia S. Schnohr, Mark C. Ridgway (Herausgeber)

Buch | Softcover

XVI, 361 Seiten

2016 | 1. Softcover reprint of the original 1st ed. 2015
Springer Berlin (Verlag)
978-3-662-52212-7 (ISBN)

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X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these materials today and tomorrow necessitates a detailed knowledge of their structural and vibrational properties. Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field. A short introduction of the technique, aimed primarily at XAS newcomers, is followed by twenty independent chapters dedicated to distinct groups of materials. Topics span dopants in crystalline semiconductors and disorder in amorphous semiconductors to alloys and nanometric material as well as in-situ measurements of the effects of temperature and pressure. Summarizing research in their respective fields, the authors highlight important experimental findings and demonstrate the capabilities and applications of the XAS technique. This book provides a comprehensive review and valuable reference guide for both XAS newcomers and experts involved in semiconductor materials research.

Introduction to XAS.- Crystalline Semiconductors.- Disordered Semiconductors.- Nanostructures.- Magnetic Semiconductors.

Erscheinungsdatum	29.08.2016
Reihe/Serie	Springer Series in Optical Sciences
Zusatzinfo	XVI, 361 p. 185 illus., 86 illus. in color.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
Themenwelt	Technik ► Elektrotechnik / Energietechnik
Schlagworte	Amorphous Semiconductors • Applied and Technical Physics • applied physics • Characterization and Evaluation of Materials • Disordered Semiconductors • Electricity, electromagnetism and magnetism • Electronic devices and materials • Nanoparticles in Semiconductors • optical and electronic materials • optical physics • optical properties of semiconductors • Optics and Electrodynamics • Physics and Astronomy • Porous Semiconductors • Scientific equipment, experiments and techniques • semiconductors • Spectroscopy and Microscopy • Spectrum analysis, spectrochemistry, mass spectrom • Structural Properties of Semiconductors • Testing of materials • Vibrational Anisotropy • Vibrational Properties of Semiconductors • XAS Book • X-ray absorption spectroscopy
ISBN-10	3-662-52212-8 / 3662522128
ISBN-13	978-3-662-52212-7 / 9783662522127
Zustand	Neuware