Ellipsometry of Functional Organic Surfaces and Films
Seiten
2016
|
1. Softcover reprint of the original 1st ed. 2014
Springer Berlin (Verlag)
978-3-662-51020-9 (ISBN)
Springer Berlin (Verlag)
978-3-662-51020-9 (ISBN)
This book provides a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces.
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years.
Biomolecules at surfaces.- Smart polymer surfaces and films.- Nanostructured surfaces and organic/inorganic hybrids.- Thin films of organic semiconductors for OPV, OLEDs and OTFT.- Developments in ellipsometric real-time/in-situ monitoring techniques.- Infrared brillant light sources for micro-ellipsometric studies of organic films.- Collection of optical constants of organic layers.
| Erscheinungsdatum | 29.08.2016 |
|---|---|
| Reihe/Serie | Springer Series in Surface Sciences |
| Zusatzinfo | XXI, 363 p. 216 illus., 55 illus. in color. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
| Naturwissenschaften ► Physik / Astronomie ► Theoretische Physik | |
| Schlagworte | Applied Optics • Biomolecules at Surfaces • Characterization and Evaluation of Materials • Characterization of Organic Semiconductors for OPV • Characterization of Organic Semiconductors for OPV, • Chemistry and Materials Science • Condensed matter physics (liquid state and solid s • Ellipsometric Real-time/In-situ Monitoring Techniq • Ellipsometric Real-time/In-situ Monitoring Techniques • Functional and Smart Films • Infrared Brillant Light Sources for Micro-ellipsom • Infrared Brillant Light Sources for Micro-ellipsometric Studies • Materials Science • Nanostructured Surfaces • OLEDs and OTFT • Optical constants • Optical Constants of Organic Layers • optical physics • Optics, Optoelectronics, Plasmonics and Optical De • Organic and Hybrid Materials • Physical Chemistry • Smart Polymer Surfaces and Films • Surface and Interface Science, Thin Films • Surface chemistry and adsorption • Surfaces and Interfaces, Thin Films • Testing of materials |
| ISBN-10 | 3-662-51020-0 / 3662510200 |
| ISBN-13 | 978-3-662-51020-9 / 9783662510209 |
| Zustand | Neuware |
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