Resonant X-Ray Scattering in Correlated Systems
Springer Berlin (Verlag)
978-3-662-53225-6 (ISBN)
Prof. Dr. Youichi Murakami is director of the Photon Factory at the Institute of Materials Structure Science at the High Energy Accelerator Research Organization (KEK) in Japan.Prof. Dr. Sumio Ishihara is head of the Theory of Condensed Matter Physics group in the Department of Physics at Tohoku University in Japan.
Resonant X-ray Scattering and Orbital Degree of Freedom in Correlated Electron Systems (S. Ishihara).- Resonant X-ray scattering in 3d electron systems (H. Nakao).- Observation of multipole orderings in f-electron systems by resonant x-ray diffraction (T. Matsumura).- Hard X-ray Resonant Scattering for Studying Magnetism (T. Arima).- Resonant soft x-ray scattering studies of transition-metal oxides (H. Wadati).- Resonant inelastic x-ray scattering in strongly correlated copper oxides (K. Ishii).
Erscheinungsdatum | 26.01.2017 |
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Reihe/Serie | Springer Tracts in Modern Physics |
Zusatzinfo | VII, 241 p. 151 illus., 25 illus. in color. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik | |
Naturwissenschaften ► Physik / Astronomie ► Thermodynamik | |
Schlagworte | Characterization and Evaluation of Materials • Condensed matter physics • Nanotechnology and Microengineering • Orbital Ordering • Physics and Astronomy • Resonant X-ray Scattering • Scattering Transition Metal Oxides • Spectroscopy and Microscopy • strongly correlated electron systems • X-ray diffraction • X-ray Scattering Oxides |
ISBN-10 | 3-662-53225-5 / 3662532255 |
ISBN-13 | 978-3-662-53225-6 / 9783662532256 |
Zustand | Neuware |
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