XAFS Techniques for Catalysts, Nanomaterials, and Surfaces
Springer International Publishing (Verlag)
978-3-319-43864-1 (ISBN)
Yasuhiro Iwasawa is a Professor at The University of Electro-Communications, Tokyo, Japan. Kiyotaka Asakura is a Professor at Hokkaido University, Sapporo, Japan. Mizuki Tada is a Professor at Nagoya University, Nagoya, Japan.
Introduction to XAFS.- History of XAFS for catalysts and surfaces.- Present status of XAFS .- Theory and analysis of XAFS.- Theory of EXAFS.- Theory of XANES.- Analysis of EXAFS and XANES.- Sources and measurement methods for XAFS.- SR sources.- Bending magnets and Wigglers.- Undulator.- XFEL.- Measurements and detectors.- Cell designs.- Advanced XAFS techniques.- In-situ XAFS under catalytic and extreme conditions.- Time-resolved XAFS.- Quick.- Dispersive.- Pump-Probe.- Spatially resolved XAFS.- Micro-XAFS and Nano-XAFS.- XAFS imaging.- In-operando XAFS.- XAFS for ultra dilute systems.- Total reflection XAFS and related XAFS.- High energy resolution XAFS.- XAFS Raman.- Oak Ridge and European Synchrotron Facilities.- XANES applications.- XAFS Applications.- Catalytic nanoclusters and nanoparticles.- Nano oxides and zeolites.- Chemically designed surfaces for catalysts.- Fuel cells.- Batteries.- Surfaces.- Sensors.- Bimetallic materials.- homogeneous catalysts.- Enzymes and models.- Green Catalysts.- Environmental catalysts.- Solid/liquid interfaces.- choice from Oak Ridge.- choice from European Synchrotron Facilities.
Erscheinungsdatum | 11.11.2016 |
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Zusatzinfo | IX, 556 p. 259 illus., 226 illus. in color. |
Verlagsort | Cham |
Sprache | englisch |
Maße | 155 x 235 mm |
Themenwelt | Naturwissenschaften ► Chemie ► Physikalische Chemie |
Technik | |
Schlagworte | catalysis • Characterization and Evaluation of Materials • Chemistry and Materials Science • Heterogenous Catalysis • High Energy Resolution XAFS • nanotechnology • Novel Catalytic Reactors • Operando Catalysis • Spectroscopy and Microscopy • Surfaces and Interfaces, Thin Films • Time Resolved XAFS • XAFS • XANES • XFEL • X-ray absorption |
ISBN-10 | 3-319-43864-6 / 3319438646 |
ISBN-13 | 978-3-319-43864-1 / 9783319438641 |
Zustand | Neuware |
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