Radiation characteristics of extreme UV and soft X-ray sources

Tobias Mey (Autor)

Buch | Softcover

131 Seiten

2015
Universitätsverlag Göttingen
978-3-86395-211-2 (ISBN)

Infos

Electromagnetic radiation in the extreme UV and soft x-ray spectral range is of steadily increasing importance in fundamental research and industrial applications. An optimum use of the available photons can only be achieved under condition of a comprehensive beam characterization. Following that goal, this work addresses the pathway of extreme UV and soft x-ray radiation from its generation, through the beam transport by the beamline to the probe position. Experimentally, those aspects are optimized at a laser-produced plasma source and at an arrangement for the generation of high-harmonics. Additionally, the coherence of laser beams is analyzed by measurements of the Wigner distribution function. This method is applied to the photon beam of the free-electron laser FLASH, resulting in the entire characterization of its propagation properties.

Produkt-Details

• Reihe/Serie: Göttingen Series in X-ray Physics ; 15
• Sprache: englisch
• Maße: 170 x 240 mm
• Einbandart: Paperback
• Themenwelt: Naturwissenschaften ► Physik / Astronomie ► Allgemeines / Lexika
• Schlagworte: Elektromagnetische Strahlung • extreme UV • Weiche Röntgenstrahlung
• ISBN-10: 3-86395-211-1 / 3863952111
• ISBN-13: 978-3-86395-211-2 / 9783863952112
• Zustand: Neuware