Optical and Electronic Process of Nano-Matters

Buch | Hardcover

334 Seiten

2001
Springer (Verlag)
978-0-7923-6987-5 (ISBN)

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Sizes of electronic and photonic devices are decreasing drastically in order to increase the degree of integration for large-capacity and ultrahigh speed signal transmission and information processing. This miniaturization must be rapidly progressed from now onward. For this progress, the sizes of materials for composing these devices will be also decreased to several nanometers. If such a nanometer-sized material is combined with the photons and/or some other fields, it can exhibit specific characters, which are considerably different from those ofbulky macroscopic systems. This combined system has been called as a mesoscopic system. The first purpose of this book is to study the physics of the mesoscopic system. For this study, it is essential to diagnose the characteristics of miniaturized devices and materials with the spatial resolution as high as several nanometers or even higher. Therefore, novel methods, e.g., scanning probe microscopy, should be developed for such the high-resolution diagnostics. The second purpose of this book is to explore the possibility of developing new methods for these diagnostics by utilizing local interaction between materials and electron, photon, atomic force, and so on. Conformation and structure of the materials of the mesoscopic system can be modified by enhancing the local interaction between the materials and electromagnetic field. This modification can suggest the possibility of novel nano-fabrication methods. The third purpose of this book is to explore the methods for such nano-fabrication.

1 Electronic and Electromagnetic Properties in Nanometer Scales.- 2 Electron Transport in Semiconductor Quantum Dots.- 3 Electron Energy Modulation with Optical Evanescent Waves.- 4 Interactions of Electrons and Electromagnetic Fields in a Single Molecule.- 5 Theory of Electronic and Atomic Processes in Scanning Probe Microscopy.- 6 Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures.- 7 Near-Field Optical Spectroscopy of Single Quantum Dots.- 8 Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration.- 9 Noncontact Atomic Force Microscopy.- 10 Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO2/Si System.- 11 Characterization of Molecular Films by a Scanning Probe Microscope.

Erscheint lt. Verlag	31.10.2001
Reihe/Serie	Advances in Opto-Electronics ; 8
Zusatzinfo	XII, 334 p.
Verlagsort	Dordrecht
Sprache	englisch
Maße	155 x 235 mm
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Elektrodynamik
	Naturwissenschaften ► Physik / Astronomie ► Optik
	Technik ► Maschinenbau
ISBN-10	0-7923-6987-4 / 0792369874
ISBN-13	978-0-7923-6987-5 / 9780792369875
Zustand	Neuware