Advances in Imaging and Electron Physics
Academic Press Inc (Verlag)
978-0-12-802380-8 (ISBN)
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
CISCEM 2014 Niels de Jonge
Progress and Development of Direct Detectors for Cryo-Electron MicroscopyA. R. Faruqi, Richard Henderson, and Greg McMullan
Electron Optics and Electron Microscopy Conference Proceedings and Abstracts: A Supplement Peter W. Hawkes
Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the NanoscaleGrzegorz Wielgoszewski and Teodor Gotszalk
Erscheint lt. Verlag | 5.6.2015 |
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Reihe/Serie | Advances in Imaging and Electron Physics |
Mitarbeit |
Herausgeber (Serie): Peter W. Hawkes |
Verlagsort | San Diego |
Sprache | englisch |
Maße | 152 x 229 mm |
Gewicht | 570 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik | |
Technik ► Elektrotechnik / Energietechnik | |
ISBN-10 | 0-12-802380-5 / 0128023805 |
ISBN-13 | 978-0-12-802380-8 / 9780128023808 |
Zustand | Neuware |
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