Advances in Imaging and Electron Physics

Buch | Hardcover

232 Seiten

2015
Academic Press Inc (Verlag)
978-0-12-802254-2 (ISBN)

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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Pattern Generators for Reflective Electron-Beam Lithography (REBL)Allen M. Carroll
Recent Developments in Time-of-Flight Mass SpectrometryFrank Gunzer and Jürgen Grotemeyer
A Special Voice Transform, Analytic Wavelets, and Zernike FunctionsMargit Pap
The Hankel Transform in n-dimensions and Its Applications in Optical Propagation and ImagingColin Sheppard

Reihe/Serie	Advances in Imaging and Electron Physics
Mitarbeit	Herausgeber (Serie): Peter W. Hawkes
Verlagsort	San Diego
Sprache	englisch
Maße	152 x 229 mm
Gewicht	520 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Hochenergiephysik / Teilchenphysik
Themenwelt	Technik ► Elektrotechnik / Energietechnik
ISBN-10	0-12-802254-X / 012802254X
ISBN-13	978-0-12-802254-2 / 9780128022542
Zustand	Neuware