Nicht aus der Schweiz? Besuchen Sie lehmanns.de
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse - Gottfried Möllenstedt

Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Buch | Softcover
XII, 612 Seiten
1969 | 1. Softcover reprint of the original 1st ed. 1969
Springer Berlin (Verlag)
978-3-662-22845-6 (ISBN)
CHF 76,95 inkl. MwSt
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanforcl. California in 1962, and at Orsay, Francein 1965. The participants in the 1961-l Conferenct came from the following countries: Germany 140, France 60, Great Britain 55, USA 20. Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine. Poland, South Africa. As at the latest congress in Paris the following central topics were treated: Gentral problems of X-ray optics, physical bases of electron beam microanalysis. quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for tht car·eful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation.

X-Ray Optics.- Electron Probe Microanalysis. Physical Bases.- Electron Probe Microanalysis. Quantitative Analysis.- Instrumentation.- Microdiffraction.- Metallurgical and Mineralogical Applications.- Biological Applications.

Erscheint lt. Verlag 1.1.1969
Zusatzinfo XII, 612 S. 690 Abb., 3 Abb. in Farbe.
Verlagsort Berlin
Sprache deutsch
Maße 155 x 235 mm
Gewicht 936 g
Themenwelt Naturwissenschaften Physik / Astronomie Optik
Naturwissenschaften Physik / Astronomie Quantenphysik
Naturwissenschaften Physik / Astronomie Theoretische Physik
Schlagworte Dichte • Elektronen • Energie • Kohlenstoff • Legierungen • Mineral • Neuron • Optik • Ordnungszahl • Phase • Phasen • Röntgenstrahlen • Spektrometrie • Teilchen • Wellen
ISBN-10 3-662-22845-9 / 3662228459
ISBN-13 978-3-662-22845-6 / 9783662228456
Zustand Neuware
Haben Sie eine Frage zum Produkt?
Mehr entdecken
aus dem Bereich
Grundlagen - Verfahren - Anwendungen - Beispiele

von Jens Bliedtner

Buch | Hardcover (2022)
Hanser, Carl (Verlag)
CHF 69,95

von Eugene Hecht

Buch | Hardcover (2023)
De Gruyter Oldenbourg (Verlag)
CHF 159,95