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Semiconductor Research -

Semiconductor Research

Experimental Techniques

Amalia Patane, Naci Balkan (Herausgeber)

Buch | Softcover
XX, 372 Seiten
2014 | 2012
Springer Berlin (Verlag)
978-3-642-43290-3 (ISBN)
CHF 179,70 inkl. MwSt
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This book covers fundamentals, recent progress and key techniques in semiconductor research, explains the application potential of analytical methods and discusses use of specific techniques to study such novel semiconductor compounds as dilute nitride alloys.
The book describes the fundamentals, latest developments and use of key experimental techniques for semiconductor research. It explains the application potential of various analytical methods and discusses the opportunities to apply particular analytical techniques to study novel semiconductor compounds, such as dilute nitride alloys. The emphasis is on the technique rather than on the particular system studied.

Electron Diffraction: RHEED and LEED.- Transmission Electron Microscopy and Energy-Dispersive X-ray Spectroscopy.- Techniques for Surface Characterization.- Optical Modulation Spectroscopy.- Photoluminescence and Magnetophotoluminescence.- High Pressure Studies.- Microphotoluminescence, Scanning Near-Field Optical Microscopy and Cathodoluminescence.- Time Resolved Optical Spectroscopy.- Raman Spectroscopy.- Cyclotron Resonance.- Transport in High Magnetic Fields.- Photoconductivity.- Hot Carrier Transport.

Erscheint lt. Verlag 9.5.2014
Reihe/Serie Springer Series in Materials Science
Zusatzinfo XX, 372 p.
Verlagsort Berlin
Sprache englisch
Maße 155 x 235 mm
Gewicht 599 g
Themenwelt Naturwissenschaften Physik / Astronomie Atom- / Kern- / Molekularphysik
Technik Elektrotechnik / Energietechnik
Schlagworte catodoluminescence • Cyclotron resonance • hot carrier transport • optical modulation spectroscopy • photoluminescence • Raman spectroscopy • scaning near field optical microscopy • time resolved optical spectroscopy • transmision electron microscopy • transport in high magnetic fields
ISBN-10 3-642-43290-5 / 3642432905
ISBN-13 978-3-642-43290-3 / 9783642432903
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