Electron Energy Loss Spectroscopy
Bios Scientific Publishers Ltd (Verlag)
978-1-85996-134-6 (ISBN)
Rik Brydson is a reader in Materials Characterization in the Materials Department at the University of Leeds in the UK. He has extensive experience of the application of microanalysis, particularly EELS, to a large range of chemical, physical, geological and materials problems.
Abbreviations -- Preface -- Acknowledgements -- 1. Introduction -- What is EELS? -- Interaction of electrons with matter -- Basics of the TEM -- Comparison of EELS in TEM with other spectroscopies -- Conclusions -- References -- 2. The EEL spectrum -- The primary transmitted electron signal -- Historical development -- Basic components of an EEL spectrum -- Basic physics -- Summary of analytical uses -- References -- 3. EELS instrumentation and experimental aspects -- The electron spectrometer -- Coupling a magnetic spectrometer to the microscope -- Spectral recording -- Energy-filtered imaging -- Choice of experimental conditions for EELS -- Specimen parameters -- Summary of experimental set-up and data acquisition procedures for EELS -- Summary of data correction procedures for EELS -- References and further reading -- 4. Low loss spectroscopy -- Quantification of sample thickness -- Quantitative aspects of low loss data -- Experimental aspects of EELS low loss measurements -- Conclusions -- References and further reading -- 5. Elemental quantification -- Quantification of EEL spectra -- Background removal -- Determination of the ionization cross-section -- Final quantification step -- Summary of the quantification procedure -- Summary of experimental quantification parameters -- Accuracy and detection sensitivity of EELS quantification and comparison with EDX in the TEM -- References and further reading -- 6. Fine structure on inner-shell ionization edges (ELNESIEXELFS) -- Origin of edge fine structure -- Determination of coordinations -- Determination of valencies -- Determination of bond lengths -- Experimental aspects of ELNESIEXELFS measurements -- Conclusions -- References and further reading -- 7. EELS imaging -- Introduction to EELS imaging and energy filtering -- Summary of energy-filtering techniques -- Procedure for EFTEM elemental mapping -- Experimental parameters in EFTEM -- Correlation of elemental maps -- General strategy for EFTEM elemental analysis -- Experimental procedure for EFTEM image acquisition and processing -- Comparison of EFTEM and spectrum imaging methods -- Energy-filtered tomography -- Conclusions -- References and further reading -- 8. Advanced EELS techniques in the TEM -- Orientation dependency in EELS -- Spatially resolved measurements -- Electron Compton scattering -- Reflection mode and surface measurements -- References and further reading -- 9. Conclusions -- Further reading -- Further resources -- Index.
| Erscheint lt. Verlag | 15.6.2001 |
|---|---|
| Verlagsort | London |
| Sprache | englisch |
| Maße | 156 x 234 mm |
| Gewicht | 226 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
| ISBN-10 | 1-85996-134-7 / 1859961347 |
| ISBN-13 | 978-1-85996-134-6 / 9781859961346 |
| Zustand | Neuware |
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