Basic Concepts of X-Ray Diffraction (eBook)

Emil Zolotoyabko (Autor)

eBook Download: PDF | EPUB

2014 | 1. Auflage
312 Seiten
Wiley-VCH (Verlag)
978-3-527-68118-1 (ISBN)

Infos

Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials.

Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mössbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques.

Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Dieses Lehrbuch eines erfahrenen Universitätsdozenten gibt Antworten auf die Fragen, die Studierende wirklich stellen. Klare Illustrationen, eine klare Sprache und klar gegliederte, kurze Kapitel lassen keine Verständnisprobleme aufkommen.

Autor

Emil Zolotoyabko is Professor in the Department of Materials Science and Engineering at the Technion - Israel Institute of Technology (Haifa). He is holder of the Abraham Tulin Academic Chair and recipient of the 2001 Henry Taub Prize for Academic Excellence. Emil Zolotoyabko has authored more than 160 scientific publications, three books, and four chapters in books devoted to the development of new X-ray diffraction methods and their applications for studying the structure and dynamical characteristics of different materials systems.

Inhalt

Preface
Introduction

DIFFRACTION PHENOMENA IN OPTICS

WAVE PROPAGATION IN PERIODIC MEDIA

DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry

DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation

DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry

DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation

X-RAY ABSORPTION

DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method

RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES

X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor

X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction

APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS

APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement

APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach

APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles

APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials

IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION

X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)

INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering

INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons

TIME-RESOLVED X-RAY DIFFRACTION

X-RAY SOURCES
Synchrotron Radiation

X-RAY FOCUSING OPTICS
X-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach

X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers

Index Preface
Introduction

DIFFRACTION PHENOMENA IN OPTICS

WAVE PROPAGATION IN PERIODIC MEDIA

DYNAMICAL DIFFRACTION OF PARTICLES AND FIELDS: GENERAL CONSIDERATIONS
The Two-Beam Approximation
Diffraction Profile: The Laue Scattering Geometry
Diffraction Profile: The Bragg Scattering Geometry

DYNAMICAL X-RAY DIFFRACTION: THE EWALD-LAUE APPROACH
Dynamical X-Ray Diffraction: Two-Beam Approximation

DYNAMICAL DIFFRACTION: THE DARWIN APPROACH
Scattering by a Single Electron
Atomic Scattering Factor
Structure Factor
Scattering Amplitude from an Individual Atomic Plane
Diffraction Intensity inthe Bragg Scattering Geometry

DYNAMICAL DIFFRACTION IN NONHOMOGENEOUS MEDIA. THE TAKAGI-TAUPIN APPROACH
Takagi Equations
Taupin Equation

X-RAY ABSORPTION

DYNAMICAL DIFFRACTION IN SINGLE-SCATTERING APPROXIMATION: SIMULATION OF HIGH-RESOLUTION X-RAY DIFFRACTION IN HETEROSTRUCTURES AND MULTILAYERS
Direct Wave Summation Method

RECIPROCAL SPACE MAPPING AND STRAIN MEASUREMENTS IN HETEROSTRUCTURES

X-RAY DIFFRACTION IN KINEMATIC APPROXIMATION
X-Ray Polarization Factor
Debye-Waller Factor

X-RAY DIFFRACTION FROM POLYCRYSTALLINE MATERIALS
Ideal Mosaic Crystal
Powder Diffraction

APPLICATIONS TO MATERIALS SCIENCE: STRUCTURE ANALYSIS

APPLICATIONS TO MATERIALS SCIENCE: PHASE ANALYSIS
Internal Standard Method
Rietveld Refinement

APPLICATIONS TO MATERIALS SCIENCE: PREFERRED ORIENTATION (TEXTURE) ANALYSIS
The March-Dollase Approach

APPLICATIONS TO MATERIALS SCIENCE: LINE BROADENING ANALYSIS
Line Broadening due to Finite Crystallite Size
Line Broadening due to Microstrain Fluctuations
Williamson-Hall Method
The Convolution Approach
Instrumental Broadening
Relation between Grain Size-Induced and Microstrain-Induced Broadenings of X-Ray Diffraction Profiles

APPLICATIONS TO MATERIALS SCIENCE: RESIDUAL STRAIN/STRESS MEASUREMENTS
Strain Measurements in Single-Crystalline Systems
Residual Stress Measurements in Polycrystalline Materials

IMPACT OF LATTICE DEFECTS ON X-RAY DIFFRACTION

X-RAY DIFFRACTION MEASUREMENTS IN POLYCRYSTALS WITH HIGH SPATIAL RESOLUTION
The Theory of Energy-Variable Diffraction (EVD)

INELASTIC SCATTERING
Inelastic Neutron Scattering
Inelastic X-Ray Scattering

INTERACTION OF X-RAYS WITH ACOUSTIC WAVES
Thermal Diffuse Scattering
Coherent Scattering by Externally Excited Phonons

TIME-RESOLVED X-RAY DIFFRACTION

X-RAY SOURCES
Synchrotron Radiation

X-RAY FOCUSING OPTICS
X-Ray Focusing: Geometrical Optics Approach
X-Ray Focusing: Diffraction Optics Approach

X-RAY DIFFRACTOMETERS
High-Resolution Diffractometers
Powder Diffractometers

Index

Produkt-Details

• Erscheint lt. Verlag: 10.2.2014
• Sprache: englisch
• Themenwelt: Naturwissenschaften ► Chemie
• Themenwelt: Technik
• Schlagworte: Chemie • Chemistry • crystallography • Festkörperphysik • Festkörperphysik • Kristallographie • Materialeigenschaften • Materials Science • Materialwissenschaften • Physics • Physik • properties of materials • Röntgenbeugung • Röntgenbeugung • Solid state physics
• ISBN-10: 3-527-68118-3 / 3527681183
• ISBN-13: 978-3-527-68118-1 / 9783527681181