Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Samuel H. Cohen, Marcia L. Lightbody (Herausgeber)

Buch | Softcover

210 Seiten

2013 | Softcover reprint of the original 1st ed. 2002
Springer-Verlag New York Inc.
978-1-4757-8184-7 (ISBN)

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The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

A Prectical Approach to Understanding Surface Metrology and Its Applications.- Applications of Scanning Probe Microscopy in Materiias Science: Examples of Surface Modification and Quantitative Analysis.- Scanning Probe Microscopy in Biology with Potential Applications in Forensics.- Atomic Manipulation of Hydrogen on Hydrogen-Terminated Silicon Surfaces with Scanning Tunneling Microscope.- Apollo 11 Lunar Samples: an Examination Using Tapping Mode Atomic Force Microscopy and Other Microscopic Methods.- Novel Micromachined Cantilever Sensors for Scanning Near-Field Microscopy.- Imaging of Cell Surfaca Structure by Scanning Probe Microscopy.- A Force Limitation for Successful Observation of Atomic Defects: Defect Trappong of the Atomic Force Microscopy Tip.- A New Approach to Examine Interfacial Interaction Potential between a Thin Solid Film or a Droplet and a Smooth Substrate.- Nanometer-Scale Patterning of Surfaces Using Self-Assembly Chemistry. 1. Preliminary Studies of Polyaniline Electrodeposition on Self-Assembled Mixed Monolayers.- Local Rate of Electroless Copper Deposition By Scanning Tunneling Microscopy.- Atomic Force Microscopy of Olivine.- The Study of Sublimation Rates and Nucleation and Growth of TNT and Petn on Slica and Graphite Surfaces by Optical and Atomic Force Microscopy and Ellipsometry.- Peculiarities of the Scanning Tunneling Microscopy Probe on Porous Gallium Phosphide.- Influence of Doping Concentration on the Etching Rate of GaAs Studied by Atomic Force Microscopy.- Comparative Scanning Tunneling Microscopy Studies of CoFe2O4 Nanporaticles of Ferrofluids in Acidic Medium.- From Laboratory Measurements to the First In-Situ Analysis of Pristine Cometary Grains.- Synthesis of Pprbiotic Peptides and Oligonucleotides on Clay Mineral Surfaces: A Scanning Force Michoscopy Study.- Surface Structure and Intercalative Polymerization Studies of Smectite Clay Thin Films.- Atomic Force Microscopy—A New and Complementary Tool in Asphalt Research Compared to Scanning Electron Microscopy.

Zusatzinfo	109 Illustrations, black and white; VIII, 210 p. 109 illus.
Verlagsort	New York, NY
Sprache	englisch
Maße	178 x 254 mm
Themenwelt	Naturwissenschaften ► Biologie
	Naturwissenschaften ► Chemie ► Analytische Chemie
	Naturwissenschaften ► Physik / Astronomie ► Angewandte Physik
	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Technik ► Maschinenbau
ISBN-10	1-4757-8184-9 / 1475781849
ISBN-13	978-1-4757-8184-7 / 9781475781847
Zustand	Neuware