Applied RHEED

Reflection High-Energy Electron Diffraction During Crystal Growth

Wolfgang Braun (Autor)

Buch | Softcover

IX, 220 Seiten

2013 | Softcover reprint of the original 1st ed. 1999
Springer Berlin (Verlag)
978-3-662-15614-8 (ISBN)

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The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.

MBE-grown semiconductor interfaces.- Reflection high-energy electron diffraction (RHEED).- RHEED oscillations.- Semikinematical simulations of RHEED patterns.- Kikuchi lines.- RHEED with rotating substrates.- Reconstruction-induced phase shifts of RHEED oscillations.- Energy loss spectroscopy during growth.- Phase shifts: Models.- Applications of reconstruction-induced phase shifts.- Closing remarks.

Anyone interested in L.-M. Peng's chapter on RHEED will want to know that an entire volume on the subject has been written by W. Braun (9). This is a substantial work, full of practical detail...
Ultramicroscopy, 2001/87

Erscheint lt. Verlag	20.11.2013
Reihe/Serie	Springer Tracts in Modern Physics
Zusatzinfo	IX, 220 p. 180 illus., 11 illus. in color.
Verlagsort	Berlin
Sprache	englisch
Maße	155 x 235 mm
Gewicht	348 g
Themenwelt	Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik
	Naturwissenschaften ► Physik / Astronomie ► Festkörperphysik
	Naturwissenschaften ► Physik / Astronomie ► Thermodynamik
Schlagworte	Electron Energy Loss Spectroscopy • Epitaxy • semiconductor • Simulation • spectroscopy
ISBN-10	3-662-15614-8 / 3662156148
ISBN-13	978-3-662-15614-8 / 9783662156148
Zustand	Neuware