Scanning Tunneling Microscopy and Its Application

Chunli Bai (Autor)

Buch | Hardcover

XIV, 370 Seiten

2000 | 2nd rev. ed. 2000
Springer Berlin (Verlag)
978-3-540-65715-6 (ISBN)

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Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

1. Introduction, 2. The Tunneling Effect, 3. Spectroscopy and Spectroscopic Imaging, 4. STM Instrumentation, 5. Other Related Scanning Probe Microscopes, 6. STM Studies of Clean Surfaces, 7. Surface Adsorbates and Surface Chemistry, 8. Biological Applications, 9. Surface Modification.

Erscheint lt. Verlag	10.8.2000
Reihe/Serie	Springer Series in Surface Sciences
Zusatzinfo	XIV, 370 p.
Verlagsort	Berlin
Sprache	englisch
Maße	156 x 234 mm
Gewicht	662 g
Themenwelt	Naturwissenschaften ► Chemie ► Physikalische Chemie
Themenwelt	Technik ► Maschinenbau
Schlagworte	electronic structure of surfaces • Nanobiology • Nanoscience • Nanospectroscopy • Rastertunnelmikroskopie • Scanning Force Microscopy • Scanning Probe Microscopy • Scanning Tunneling Microscopy • STM instrumentation • surface adsorption • Surface Chemistry • Surface Science • surface structure • Tunneling effect • Tunneling Spectroscopy
ISBN-10	3-540-65715-0 / 3540657150
ISBN-13	978-3-540-65715-6 / 9783540657156
Zustand	Neuware