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Electron Microscopy XIV -

Electron Microscopy XIV

Software / Digital Media
350 Seiten
2012
Trans Tech Publications Ltd (Hersteller)
978-3-03795-204-7 (ISBN)
CHF 257,25 inkl. MwSt
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Selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM 2011), June 26-30, 2011, Wisla, Poland
These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines.
Erscheint lt. Verlag 1.8.2012
Reihe/Serie Solid State Phenomena ; Volume 186
Verlagsort Zurich
Sprache englisch
Maße 125 x 142 mm
Gewicht 200 g
Themenwelt Naturwissenschaften
Technik Maschinenbau
ISBN-10 3-03795-204-0 / 3037952040
ISBN-13 978-3-03795-204-7 / 9783037952047
Zustand Neuware
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