Auger Spectroscopy and Electronic Structure
Springer Berlin (Verlag)
978-3-642-75068-7 (ISBN)
I Introduction.- Experimental Probes of Electron Correlation Effects and the Influence on the Electronic Structure.- II Theory of the Auger Process and Electronic Structure Determination.- Theory of the Auger Spectra of Ca-Si Compounds.- Surface Effects and Core-Hole Effects in Auger Spectra of Metals and Semiconductors.- Auger Transition Rate Calculations for Systems with Open Subshells: Insight into Core Hole Screening in Simple Metals.- Comments on the Relationship Between Auger Lineshapes and Local Electronic Structure.- The Local Densities of States of 4d Transition Metals.- A Multiple Scattering Approach to the Interpretation of Interlayer and Intralayer Interactions in TiSe2 Clusters.- On the Theory of Auger Induced Desorption.- III Auger Spectra from Solid and Gaseous Samples.- The Local Density of States in Simple Metals and Their Alloys as Revealed by Auger Spectroscopy.- Spin Polarized Auger Spectroscopy from Magnetically Ordered Solids.- Auger Study of the Electronic Correlations in YBa2Cu3O7-?.- Valence Electron States in Gd-Silicides via Si-L2,3VV Auger Lineshape Analysis.- Correlation Effects in Photoemission and Auger Spectra of Palladium.- Recent Successes in Understanding the Electronic Structure of CuPd Alloys.- Resonant Auger Emission at the La 3d-Excitation Threshold.- On the Theory of the Auger CVV Lineshape of Graphite.- Surface Auger and Double Hole Shifts in Ni(100).- Auger Spectra Induced by Ar+ Bombardment on Silicon and Silicides.- Auger and Secondary Emission Electronic Structural Characteristics in Metals and Insulators.- XPS and Auger Spectra of Some Differently Substituted Indoles.- Near Threshold Effects in Ar and CO Auger Spectra.- On the Silicon CVV Spectra of Tetramethylsilane and Other Molecules in the Gas Phase.- IV AnalyticalAspects of Auger Electron Emission.- The Role of Electron Backscattering in AES.- Application of the Pattern Recognition Method in Auger Electron Spectroscopy.- Chemical Information from Auger Spectra.- Polymer Formation on Nickel Surfaces at Elevated Temperature.- Electron Spectroscopic Studies of Acetylene Adsorption on Polycrystalline Iron Films.- Photoelectron and Auger Electron Emission from Physisorbed Xenon.- An Auger Spectroscopy Study of the Influence of Sputter Ambient on the Electrical Characteristics of PtSi/Si Contacts.- Temperature and Core Hole Dependence of EXFAS (Extended Fine Auger Structure) of Ag(111) and Cu.- A Technique for Performing Angle-Resolved Auger Electron Spectroscopy (ARAES) and Angle-Resolved Electron Energy Loss Spectroscopy (ARELS).- V Complementary Techniques.- BIS Investigation of the Co/Si(111) Interface Formation.- Photoemission and Scanning Tunneling Microscopy.- Index of Contributors.
Erscheint lt. Verlag | 23.12.2011 |
---|---|
Reihe/Serie | Springer Series in Surface Sciences |
Zusatzinfo | X, 277 p. |
Verlagsort | Berlin |
Sprache | englisch |
Maße | 155 x 235 mm |
Gewicht | 445 g |
Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Atom- / Kern- / Molekularphysik |
Schlagworte | surface analysis • Surface Electronic Structure • Surface Physics |
ISBN-10 | 3-642-75068-0 / 3642750680 |
ISBN-13 | 978-3-642-75068-7 / 9783642750687 |
Zustand | Neuware |
Haben Sie eine Frage zum Produkt? |
aus dem Bereich