Acoustic Scanning Probe Microscopy
Seiten
2012
|
2013
Springer Berlin (Verlag)
978-3-642-27493-0 (ISBN)
Springer Berlin (Verlag)
978-3-642-27493-0 (ISBN)
This comprehensive presentation of a powerful new technology deals with everything from basic theoretical explanations to calibration, enhancement, and applications. It also compares the advantages of the process to more established scanning probe methods.
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
The combination of atomic force microscopy with ultrasonic methods allows the nearfield detection of acoustic signals. The nondestructive characterization and nanoscale quantitative mapping of surface adhesion and stiffness or friction is possible. The aim of this book is to provide a comprehensive review of different scanning probe acoustic techniques, including AFAM, UAFM, SNFUH, UFM, SMM and torsional tapping modes. Basic theoretical explanations are given to understand not only the probe dynamics but also the dynamics of tip surface contacts. Calibration and enhancement are discussed to better define the performance of the techniques, which are also compared with other classical techniques such as nanoindentation or surface acoustic wave. Different application fields are described, including biological surfaces, polymers and thin films.
From the contents: Overview of acoustic techniques.- Contact dynamics modelling.- Cantilever dynamics: theoretical modeling.- Finite elements modelling.- AFAM calibration.- Enhanced sensitivity.- UAFM.- Holography calibration.- UFM.- Friction/lateral techniques.- Harmonix.- Scanning microdeformation microscopy (SMM).- Tip wear.- Comparison with other techniques.- Applications polymer.- Thin films.
| Erscheint lt. Verlag | 4.10.2012 |
|---|---|
| Reihe/Serie | NanoScience and Technology |
| Zusatzinfo | XXVI, 494 p. |
| Verlagsort | Berlin |
| Sprache | englisch |
| Maße | 155 x 235 mm |
| Gewicht | 894 g |
| Themenwelt | Naturwissenschaften ► Physik / Astronomie ► Optik |
| Technik ► Elektrotechnik / Energietechnik | |
| Schlagworte | acoustic microscopy techniques • acoustic properties of materials • AFAM calibration • AFM instrumental capabilities • biological nanoanalysis • cantilever dynamics • Dynamics Modelling • holography calibration • mechanical characterization • Mechanical properties of materials • nanoanalysis • quantitative characterization • Scanning Microdeformation Microscopy • Scanning Probe Microscopy • surface mapping |
| ISBN-10 | 3-642-27493-5 / 3642274935 |
| ISBN-13 | 978-3-642-27493-0 / 9783642274930 |
| Zustand | Neuware |
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